Zobrazeno 1 - 10
of 45
pro vyhledávání: '"L. Pajasová"'
Autor:
V. Železný, Dagmar Chvostova, L. Pajasová, Tomáš Kocourek, Miroslav Jelinek, Stanislav Daniš, Václav Valvoda
Publikováno v:
Thin Solid Films. 571:416-419
Optical properties of Ba 0.75 Sr 0.25 TiO 3 (BST(75/25)) ferroelectric thin film have been investigated by spectroscopic ellipsometry in a broad temperature interval from 10 to 300 K. The polycrystalline perovskite-phase BST films were prepared by pu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d1c8a82b6f57ea06fb721efd3645cb9f
https://doi.org/10.1016/j.tsf.2013.11.147
https://doi.org/10.1016/j.tsf.2013.11.147
Publikováno v:
Applied Physics A. 100:1217-1220
Optical properties of epitaxial BiFeO3 thin films grown via pulsed-laser deposition on (110) DyScO3 substrates have been investigated. Their near-normal spectroscopic reflectivity was measured in the spectral range 2 to 14 eV at room temperature, whi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::51fd75bb2ec04180c1ae3b2f328c563f
https://doi.org/10.1007/s00339-010-5881-z
https://doi.org/10.1007/s00339-010-5881-z
Autor:
Dagmar Chvostova, L. Pajasová, Miroslav Jelinek, Tomáš Kocourek, Stanislav Daniš, V. Valvoda, V. Železný
Publikováno v:
Applied Surface Science. 255:5280-5283
Optical properties of plasma laser-deposited Ba0.75Sr0.25TiO3 (BST) thin films have been investigated using variable angle spectroscopic ellipsometry (VASE) and near-normal spectroscopic reflectivity (NNSR) within a broad spectral range at room tempe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b8827f0ff6abe2e8ece853eb157647ae
https://doi.org/10.1016/j.apsusc.2008.08.076
https://doi.org/10.1016/j.apsusc.2008.08.076
Publikováno v:
Ferroelectrics. 370:126-131
Optical properties of Ba 0.25 Sr 0.75 TiO 3 thin films fabricated by pulsed laser deposition (PLD) have been investigated using variable angle spectroscopic ellipsometry (VASE) and near-normal spectroscopic reflectivity (NNSR). The measurements were
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d91334ca3df9e3ffb16909151630e5e7
https://doi.org/10.1080/00150190802384476
https://doi.org/10.1080/00150190802384476
Autor:
Alexander Tarasenko, L. Pajasová, P. Kúš, L. Satrapinský, V. Železný, A. Plecenı́k, Dagmar Chvostova
Publikováno v:
Thin Solid Films. :213-216
The polycrystalline MgB 2 thin films were prepared on Al 2 O 3 and Si substrates. Their optical properties in the broad spectral range (30–110 000 cm −1 ) have been studied by the normal incidence reflectance and ellipsometry. The model consistin
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4a268475692f81c57346186a4d5e0669
https://doi.org/10.1016/j.tsf.2004.01.007
https://doi.org/10.1016/j.tsf.2004.01.007
Publikováno v:
Applied Physics A: Materials Science & Processing. 63:495-503
Optical properties of semi-insulating polycrystalline silicon (SIPOS) films were investigated over the wide region of wavelengths. The vibrational modes of Si-O-Si and Si-Si bonds were studied by IR and Raman spectroscopy. A pronounced effect of oxyg
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::29eb67664d56cd6fb404d33f0482cdc8
https://doi.org/10.1007/s003390050423
https://doi.org/10.1007/s003390050423
Publikováno v:
Journal of Non-Crystalline Solids. 45:289-292
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::eb813a41be519ee082ff69e1b495753c
https://doi.org/10.1016/0022-3093(81)90195-2
https://doi.org/10.1016/0022-3093(81)90195-2
Publikováno v:
Solar Energy Materials. 4:1-10
This paper deals with the investigation of the optical properties of amorphous silicon prepared by sputtering in argon (a-Si) and in a mixture of argon with 10% hydrogen (a-Si:H) at the same temperature as the substrate (180–190dgC). The imaginary
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::dc98888f865e4db5ab4c582fa3ce0618
https://doi.org/10.1016/0165-1633(80)90015-5
https://doi.org/10.1016/0165-1633(80)90015-5
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 261:131-137
This paper reports on evaluation of measurements of reflectivity on III–V semiconductors GaAs for a broad spectral range. The measurements were made using both a classical source (from 4 to 13 eV) and synchrotron radiation from the VEPP-2M storage
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c2cb3e461bf91989625b84426b82db20
https://doi.org/10.1016/0168-9002(87)90580-8
https://doi.org/10.1016/0168-9002(87)90580-8
Publikováno v:
Czechoslovak Journal of Physics. 33:101-107
The dispersion of the optical constants ei and e2 was determined in the 0−e eV interval from the measured reflectivity on thin films of a-GeCh. Despite the certain nonstoichiometry, the results obtained on sulphide agree well with those of another
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::11d40ce730240f9ce160f06f07490d56
https://doi.org/10.1007/bf01597343
https://doi.org/10.1007/bf01597343