Zobrazeno 1 - 5
of 5
pro vyhledávání: '"L. M. Veretennikov"'
Publikováno v:
Journal of Physics: Conference Series
Thin bismuth films obtained by vacuum deposition were recrystallized under electron beam of scanning electron microscope at 5 kV and examined in a transmission electron microscope at 200 kV. In recrystallized films, various microstructures were detec
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ceaee9c28c7958ede43bb946a5bd4510
https://iopscience.iop.org/article/10.1088/1742-6596/1115/3/032087/pdf
https://iopscience.iop.org/article/10.1088/1742-6596/1115/3/032087/pdf
Autor:
G. A. Kozhina, A. V. Fetisov, V. B. Fetisov, S. Kh. Estemirova, L. M. Veretennikov, E. A. Pastukhov
Publikováno v:
Doklady Physical Chemistry. 435:185-188
Publikováno v:
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ISBN: 9783540852254
Crystallization in amorphous films often results in strong internal lattice bending: TEM reveals regular rotation of initial lattice orientation across the growing microcrystals [1]. According to electron diffraction data our deposits prepared by vac
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c00043f8932356c59f4aa20912179567
https://doi.org/10.1007/978-3-540-85226-1_172
https://doi.org/10.1007/978-3-540-85226-1_172
Autor:
A. N. Timofeev, S.M. Klotsman, N. K. Arkhipova, I. P. Polikarpova, L. M. Veretennikov, G. N. Tatarinova
Publikováno v:
Physical Review B. 30:1788-1796
The temperature dependences of the volume-diffusion coefficients of Ta, Re, Os, Ir, and W have been measured for tungsten single crystals by the sectioning method. The analysis of our data and results obtained by other authors shows that the Arrheniu
Publikováno v:
Journal of Physics: Conference Series; Dec2018, Vol. 1115 Issue 3, p1-1, 1p