Zobrazeno 1 - 10
of 20
pro vyhledávání: '"L. M. Krasil'nikova"'
Publikováno v:
Russian Physics Journal. 45:493-497
Experimental proofs of asymmetric trapping of atoms at the growth step in vapor-phase epitaxy of gallium arsenide in the GaAs–AsCl3–H2 system are given. The data obtained confirm the important role of the surface diffusion mass transfer in the gr
Autor:
A. E. Shubin, P. B. Paschenko, L. M. Krasil'nikova, L. G. Lavrent'eva, I. V. Ivonin, G. A. Aleksandrova
Publikováno v:
Soviet Physics Journal. 27:379-383
Autor:
A. E. Shubin, M. P. Yakubenya, I. V. Ivonin, L. F. Lavrent'eva, G. A. Aleksandrova, L. M. Krasil'nikova
Publikováno v:
Soviet Physics Journal. 23:813-817
Kinetic (growth rate), optical, and electron-microscopic (surface relief) studies were made of the process of formation of homoepitaxial films of InAs in a chloride gas-transport system. It was found that the (111)A and B surfaces of indium arsenide
Publikováno v:
Soviet Physics Journal. 17:12-16
The data cited shows that the state of the substrate surface in the case of gallium arsenide epitaxy has a considerable and long-lasting effect on the growth kinetics. This effect is due first and foremost to those contaminants which remain on the su
Publikováno v:
Soviet Physics Journal. 18:1270-1275
The initial steps of growth of auto-epitaxial films of GaAs are studied under an electron microscope. The substantial influence of orientation on the activation kinetics of the growth relief on the initial stage, concentration of growth defects, and
Publikováno v:
Soviet Physics Journal. 28:542-546
The electrophysical properties, the lattice constant, and the structure of sulfur doped epitaxial gallium arsenide layers were investigated using a complex of methods. The experimental data indicate that the sulfur atoms can exist in the GaAs lattice
Publikováno v:
Soviet Physics Journal. 18:1258-1264
Publikováno v:
Soviet Physics Journal. 22:157-161
Electron-microscope investigations show that in the SiCl4,-H2 system at sufficiently high purity of the substrate surface and the gas-phase mixture in a low-temperature process, morphologically perfect epitaxial layers of silicon grow by a step-layer
Publikováno v:
Soviet Physics Journal. 28:149-153
The element composition and crystal structure of a second phase forming growth microdefects were investigated by electron microscopy, reflection electron diffraction, and electron-probe microanalysis at various stages of the gas-phase epitaxy of gall
Publikováno v:
Soviet Physics Journal. 19:31-37
The effect of dopants (zinc, tellurium) on the microrelief of the growth surface of autoepitaxial gallium arsenide layers is considered. It is shown that the type of dopant exerts a considerable effect on the characteristics of the microstep structur