Nanotomography endstation at the P05 beamline : Status and perspectives

Autor: I Greving, M Ogurreck, F Marschall, A Last, F Wilde, T Dose, H Burmester, L Lottermoser, M Müller, C David, F Beckmann

Publikováno v: Journal of physics / Conference Series, 849 (1), Art.Nr.: 012056
Greving, I.; Ogurreck, M.; Marschall, F.; Last, A.; Wilde, F.; Dose, T.; Burmester, H.; Lottermoser, L.; Mueller, M.; David, C.; Beckmann, F.: Nanotomography endstation at the P05 beamline: Status and perspectives. In: Journal of Physics: Conference Series . Vol. 849 (2017) 012056. (DOI: /10.1088/1742-6596/849/1/012056)

The Imaging Beamline IBL/P05 at the DESY storage ring PETRA III, operated by the Helmholtz-Zentrum Geesthacht, has two dedicated endstations optimized for micro- and nanotomography experiments [1-3]. Here we present the status of the nanotomography e

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::70e7a23b6a9ae47807e4960692e57325
https://publikationen.bibliothek.kit.edu/1000072223/4259095

Structure determination of the indium-inducedSi(111)−(4×1)reconstruction by surface x-ray diffraction

Autor: Mourits Nielsen, L. Lottermoser, Robert Feidenhans'l, Gerald Falkenberg, Jeff Baker, J. H. Zeysing, Robert L. Johnson, F. Berg-Rasmussen, Oliver Bunk

Publikováno v: Physical Review B. 59:12228-12231

A detailed structural model for the indium-induced $\mathrm{Si}(111)\ensuremath{-}(4\ifmmode\times\else\texttimes\fi{}1)$ surface reconstruction has been determined by analyzing an extensive set of x-ray-diffraction data recorded with monochromatic $

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::73c7072eeb9409835e7baf9f3e7bf446
https://doi.org/10.1103/physrevb.59.12228

Bismuth on GaSb(110): Structural Determination of the 1×1 and 1×2 Phases by Surface X-Ray Diffraction

Autor: E. Landemark, Detlef-M. Smilgies, T. van Gemmeren, L. Lottermoser, O. Bunk, Robert L. Johnson, Mourits Nielsen, Robert Feidenhans'l

Publikováno v: Surface Review and Letters. :1043-1052

The surface geometry of the 1×1 and 1×2 phases of bismuth on GaSb(110) has been determined using surface X-ray diffraction with synchrotron radiation. The bismuth atoms form zigzag chains along the [Formula: see text] direction of the substrate. Fo

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::cca4c4590b3f3480b1a21a660878d946
https://doi.org/10.1142/s0218625x98001419

Epitaxial clusters studied by synchrotron X-ray diffraction and scanning tunneling microscopy

Autor: Gerald Falkenberg, A.J. Steinfort, Jennifer L. Baker, F. Berg Rasmussen, Mourits Nielsen, Robert Feidenhans'l, L. Lottermoser, P.M.L.O. Scholte, Robert L. Johnson

Publikováno v: Physica B: Condensed Matter. 248:1-8

Nanoscale clusters are often formed during heteroepitaxial crystal growth. Misfit between the lattice parameter of the substrate and the adsorbate stimulates the formation of regular clusters with a characteristic size. The well-known “hut-clusters

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::df6c0f12c5910e75cc099eee1cd30239
https://doi.org/10.1016/s0921-4526(98)00193-8

The atomic structure of the Si(111) reconstruction

Autor: H. T. Anyele, L. Seehofer, Clarence Cherian Matthai, A. H. Levermann, Robert L. Johnson, P .B. Howes, John Emyr MacDonald, K. A. Edwards, L. Lottermoser, Gerald Falkenberg, R. Feidenhans'l

Publikováno v: Applied Surface Science. :124-129

We have studied the atomic structure of the View the MathML source reconstruction induced by adsorption of about 1.1 monolayers of Sn on Si(111) using surface X-ray diffraction (SXRD) and scanning tunnelling microscopy (STM). The experimentally obtai

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::e0dc3c0754cea50f9edc4ecc8911216d
https://doi.org/10.1016/s0169-4332(96)00132-8