Zobrazeno 1 - 10
of 13
pro vyhledávání: '"L. L. Tongson"'
Publikováno v:
MRS Proceedings. 326
Optical properties of quantum well structures, specifically (Al,Ga)As/GaAs heterojunction structures, have been studied using transient photoluminescence spectroscopy. The (Al,Ga)As/GaAS heterojunction structures that have been studied are a Ga0.7Al0
Publikováno v:
Journal of Electronic Materials. 10:433-443
Explosive crystallization of about 2-μm thick amorphous CdTe films prepared by rf-sputtering in an Ar-N2 ambient has been observed. The transformation can be initiated with or without external thermal or mechanical impulses depending on the oxygen c
Publikováno v:
Journal of Vacuum Science and Technology. 15:1133-1138
The unique sensitivity of Auger electron spectrometry (AES) to combined carbon has been exploited in measuring the surface compositions of hot‐pressed, conventionally sintered and mixed powders of WC–Co composite materials. AES sensitivity factor
Publikováno v:
Journal of Vacuum Science and Technology. 15:1129-1132
Technological innovations in the processing of WC–Co composite materials were developed recently in this laboratory. The cobalt binder is precipitated from solution onto WC grains initially. The application of low‐energy ion scattering spectromet
Publikováno v:
Journal of Electronic Materials. 14:405-418
Aluminum nitride thin films have been prepared at room temperature by reactive ion beam sputtering for potential use as a passivant and diffusion/anneal cap in compound semiconductor technology. The electrical and optical pro-perties of these films h
Autor:
L. L. Tongson, L. A. Marusak
Publikováno v:
Journal of Applied Physics. 50:4350-4355
Soft x‐ray emission spectra are obtained of sulfur in FeS, Fe0.9S, Fe0.875S, and Fe0.5S. The structure in the Kβ emission spectra is consistent with recent SCF‐Xα calculations for ferrous iron in an octahedral crystal field. Broadening in the K
Publikováno v:
Journal of Vacuum Science and Technology. 18:401-404
The interdiffusion behavior of chromium oxide films rf‐sputtered in O2 ambient onto substrates of bulk Cu as well as ∠100 nm thin films of Cu was studied using Auger electron and ion scattering spectrometries. Composition depth profiling was carr
Autor:
C B Cooper, L L Tongson
Publikováno v:
Journal of Physics E: Scientific Instruments. 10:1245-1248
A combined ion-scattering and secondary-ion mass spectrometer, for use in studies of low-energy ion bombardment of solids, is described. The secondary ions from the target (both sputtered and scattered) are analysed by a momentum analyser having a 14
Publikováno v:
Journal of Vacuum Science and Technology. 17:358-361
A comparative study of the optical properties and chemical composition of three commercially prepared black chrome solar absorber coatings has been made. In all these samples, the visible and IR spectra were nearly the same and showed no peaks corres
Publikováno v:
Journal of Applied Physics. 50:1535-1537
The chemical nature of semitransparent (∼125 A) palladium on silicon Schottky‐barrier‐type devices was determined by complementary AES and ISS techniques. Postdeposition analyses of metal‐semiconductor (MS) and metal–thin‐insulator–semi