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pro vyhledávání: '"L. J. Surges"'
Publikováno v:
Canadian Metallurgical Quarterly. 25:233-239
The ion microprobe, a form of Secondary Ion Mass Spectrometer (SIMS), is one of the most sensitive instruments for the in-situ characterization of elemental distribution in mineral phases of limited dimension. Detection limits of parts per million ha
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::71f4bc48f4c468c32270f0a61d3d9d15
https://doi.org/10.1179/cmq.1986.25.3.233
https://doi.org/10.1179/cmq.1986.25.3.233
