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pro vyhledávání: '"L. J. Duckers"'
Publikováno v:
Journal of Electronic Materials. 27:610-614
The diffusion of phosphorus in CdTe was measured as a function of anneal time and temperature in the temperature range 600–900°C. The diffusion anneals were carried out in evacuated silica capsules mainly with traces of radioactive phosphorus in t
Autor:
L J Duckers
Publikováno v:
Proceedings of the Institution of Mechanical Engineers, Part A: Journal of Power and Energy. 209:248-248