Zobrazeno 1 - 10
of 51
pro vyhledávání: '"L. Galatro"'
Autor:
M. Spirito, L. Galatro
Publikováno v:
Silicon-Germanium Heterojunction Bipolar Transistors for Mm-wave Systems Technology, Modeling and Circuit Applications ISBN: 9781003339519
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::480295b67ae126e7c8d8d8de9f1942b9
https://doi.org/10.1201/9781003339519-5
https://doi.org/10.1201/9781003339519-5
Publikováno v:
IEEE Transactions on Microwave Theory and Techniques. 68:3769-3775
In this article, we present a comprehensive analysis of the hardware and software solutions required to enable frequency scalable load-pull test benches operating in the (sub)mm-wave frequency bands. First, the constraints arising from the harmonic (
Publikováno v:
IEEE Transactions on Microwave Theory and Techniques, 67(1)
This paper analyzes and accurately models the complex noise behavior of vector network analyzers (VNAs) when measuring large-mismatch devices and subsequently shows how the VNA measurement noise performance is enhanced through implementation of a hig
Autor:
Carmine De Martino, Marco Spirito, Holger Sailer, Mohammed Alomari, L. Galatro, Joachim N. Burghartz, Jos van lt Hof
Publikováno v:
2020 95th ARFTG Microwave Measurement Conference (ARFTG).
In this contribution we present the developments and current performance of calibration substrates manufactured on 150 mm Quartz wafers (675 μm thick) based on a CMOS process technology. The passive structures required to realize on-wafer vector net
Autor:
L. Galatro, S. Malotaux, M. Marchetti, Marco Spirito, C. De Martino, J. Van lt Hof, Michele Squillante
Publikováno v:
2020 95th ARFTG Microwave Measurement Conference (ARFTG).
In this contribution we present a method for estimating linearity performance of devices operating in the higher millimeter-wave region, under modulated signals and over different loading conditions. The proposed method uses the power dependent vecto
Publikováno v:
IEEE Transactions on Microwave Theory and Techniques
In this paper, we present a thru-reflect-line (TRL) calibration/de-embedding kit integrated in the back-end-of-line of a SiGe technology, which allows direct calibration at the first metallization layer, thus moving the reference planes as close as p
Autor:
Pieter J. de Visser, Marco Spirito, Teun M. Klapwijk, Holger Thierschmann, L. Galatro, David J. Thoen, Matvey Finkel, Allard J. Katan
Publikováno v:
IEEE Transactions on Terahertz Science and Technology. 7:765-771
We present a performance analysis of passive THz components based on Microstrip transmission lines with a 2-μmthin plasma-enhanced chemical vapor deposition grown silicon nitride (PECVD SiNX) dielectric layer. A set of thru-reflect-line calibration
Publikováno v:
2019 93rd ARFTG Microwave Measurement Conference (ARFTG).
In this contribution, we present the performances of an IQ mixer-based RF-interferometer module, called the HΓ-VNA, designed to be used as an add-on to VNAs to improve the measurement sensitivity and accuracy of DUTs presenting extreme impedances (|
Publikováno v:
2018 91st ARFTG Microwave Measurement Conference (ARFTG).
In this contribution we analyze the impact of radiation losses due to multimode propagations in (single medium) calibration substrates. The impact of the complex modelling of the loss mechanism due to radiation mode is applied to the specific case of
Publikováno v:
2018 91st ARFTG Microwave Measurement Conference (ARFTG).
In this paper we present the measurement procedure to achieve direct on-wafer absolute power calibration in VNA-based mm-wave setups. The proposed approach employs 28 nm CMOS n-channel MOSFET as the power calibration transfer device, providing suffic