Zobrazeno 1 - 10
of 65
pro vyhledávání: '"L. G. Lavrent'eva"'
Autor:
M. D. Vilisova, L. G. Lavrent'eva, I. A. Bobrovnikova, S. V. Subach, V. V. Preobrazhenskii, I. V. Ivonin, S. E. Toropov, B. R. Semyagin, Mikhail A. Putyato
Publikováno v:
Semiconductors. 37:1047-1052
The effect of dopant concentration and growth-surface crystallographic orientation on the incorporation of Si into Ga and As sublattices was investigated during GaAs molecular-beam epitaxy. The epitaxial layers (epilayers) were grown on GaAs substrat
Autor:
V. V. Preobrazhenskii, M. D. Vilisova, S. E. Toropov, L. G. Lavrent'eva, A. E. Kunitsyn, Mikhail A. Putyato, B. R. Semyagin, V. V. Chaldyshev
Publikováno v:
Semiconductors. 36:953-957
Using the methods of X-ray diffraction, optical absorption in the near-infrared range, and the Hall effect, the influence of growth conditions on the structure and properties of Si-doped GaAs layers grown by low-temperature molecular-beam epitaxy was
Publikováno v:
Crystallography Reports. 47:S118-S127
A nontraditional approach to the control of GaAs properties via the introduction of an excessive amount of arsenic during growth of epitaxial layers under conditions of low-temperature molecular-beam epitaxy (LT-GaAs layers) is considered. The influe
Publikováno v:
Russian Physics Journal. 45:735-752
The present paper reviews works devoted to control over the properties of epitaxial GaAs by incorporation of excess (non-stoichiometric) arsenic into the GaAs films grown by molecular-beam epitaxy (MBE) at low-temperature (LT). The effect of excess a
Publikováno v:
Russian Physics Journal. 45:493-497
Experimental proofs of asymmetric trapping of atoms at the growth step in vapor-phase epitaxy of gallium arsenide in the GaAs–AsCl3–H2 system are given. The data obtained confirm the important role of the surface diffusion mass transfer in the gr
Autor:
M. D. Vilisova, S. E. Toropov, S. V. Subach, L. G. Lavrent'eva, B. R. Semyagin, V. V. Preobrazhenskii, I. A. Bobrovnikova, I. V. Ivonin, M. A. Putyato
Publikováno v:
Russian Physics Journal. 45:414-418
The influence of crystallographic orientation of the growth surface near (100) and (111)A GaAs singular faces on the silicon capture into A- and B-sublattices of gallium arsenide in molecular beam epitaxy is investigated by the electrophysical and ph
Publikováno v:
Russian Physics Journal. 45:997-1000
The effect of the arsenic concentration in the vapor phase on the growth step distribution over the surface of GaAs epitaxial layers grown in a chlorine-hydride vapor-transport system on substrates with 4° (111)A and (113)A orientations is studied.
Publikováno v:
Russian Physics Journal. 45:638-642
The influence of concentrations of vapor-phase growth components on the structure of singular, vicinal, and nonsingular growth surfaces of InAs epitaxial layers grown in the In–AsCl3–H2 system is investigated by the methods of electron microscopy
Autor:
S. V. Subach, M. D. Vilisova, I. T. Shulepov, T. V. Korableva, V. S. Lukash, L. G. Lavrent'eva, I. V. Ivonin, M. P. Yakubenya
Publikováno v:
Russian Physics Journal. 42:17-21
It is known that during gas-phase epitaxy of InP and GaAs the region of the film close to the heteroboundary is formed with altered phase, structural, and electrophysical properties. The main cause for this is formation of a transition layer due to a
Autor:
S. V. Subach, E. V. Chernikov, V. S. Lukash, I. V. Ivonin, A. N. Tarzimyanov, L. G. Lavrent'eva
Publikováno v:
Russian Physics Journal. 39:571-575
The initial stages in the growth of indium phosphide films on gallium arsenide substrates in a chloride gastransport system are investigated by transmission electron microscopy and electron-diffraction and secondaryion mass spectrometry techniques. I