Zobrazeno 1 - 10
of 144
pro vyhledávání: '"L. Abello"'
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.
Publikováno v:
ResearcherID
The (Na1-xKx)0.5Bi0.5TiO3 perovskite solid solution is investigated using x-ray diffraction (XRD) and Raman spectroscopy in order to follow the structural evolution between the end members Na0.5Bi0.5TiO3 (rhombohedral at 300 K) and K0.5Bi0.5TiO3 (tet
Publikováno v:
Diamond and Related Materials. 8:657-662
Raman imaging has been used to investigate the microstructure of some (100)-textured diamond films. Results have shown that different crystals within a film can give rise to different Raman line positions, intensities and line widths, with the result
Publikováno v:
Journal of Solid State Chemistry. 135:78-85
Tin dioxide nanocrystalline powders were prepared by precipitation ofα-stannic acid followed by various thermal and chemical treatments. An original preparation via a colloidal solution step led to particles having a particular two-dimensional micro
Publikováno v:
Journal of Materials Research. 12:2686-2698
A sequential analysis of the growth of diamond films on silicon substrates in a microwave plasma assisted chemical vapor deposition (CVD) reactor has been performed by Raman spectroscopy. The plasma was switched off during measurements, but the subst
Autor:
G. Lucazeau, L. Abello
Publikováno v:
Journal of Materials Research. 12:2262-2273
Vickers microindentations obtained with loads between 0.05 N and 2 N were performed on crystalline (100) silicon. The residual stress field and the different structural states induced by loading were studied by mapping the indented zones by their mic
Publikováno v:
Journal of Raman Spectroscopy. 28:283-288
Publikováno v:
Journal of Physics and Chemistry of Solids. 57:527-537
A polarized Raman study of tetragonal monocrystalline WSi 2 is reported. The two Raman lines of WSi 2 have been assigned in terms of symmetry. Using a linear chain model, force constants of 6.64 and 3.16 N/cm for compressive Si-Si and Si-W motions al
Publikováno v:
Physica Status Solidi (a). 154:55-68
Raman spectroscopy is the most frequently used tool to characterize diamond films prepared by various deposition methods. Hence, in situ Raman monitoring of the growth of plasma CVD diamond films may contribute to the understanding and the control of