Zobrazeno 1 - 10
of 24
pro vyhledávání: '"L. A. Giannuzzi"'
Autor:
C. D. Judge, H. Rajakumar, A. Korinek, G. Botton, J. Cole, J. W. Madden, J. H. Jackson, P. D. Freyer, L. A. Giannuzzi, M. Griffiths
Publikováno v:
The Minerals, Metals & Materials Series ISBN: 9783030046385
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bab58e3b1af78afc93ed202f3ce32caa
https://doi.org/10.1007/978-3-030-04639-2_47
https://doi.org/10.1007/978-3-030-04639-2_47
Publikováno v:
Journal of Materials Research. 13:1853-1860
Microstructural development of SCS-6 SiC fibers induced by creep deformation at 1400 °C is presented. Grain growth occurs in all SiC regions of the fiber during creep. Portions of the SiC4 region transform from βSiC to αSiC growing at the expense
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e09577f2e20ed06bbb155a3abbfa84e6
https://doi.org/10.1557/jmr.1998.0263
https://doi.org/10.1557/jmr.1998.0263
Publikováno v:
Journal of Electronic Materials. 22:639-644
Commercial electrodeposits are usually fine grained and highly stressed. Conventional transmission electron microscopy (TEM) studies reveal defect-free structures except for the presence of twins. However, high voltage TEM studies of thick specimens
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3076b430013866cb2106337fc741351d
https://doi.org/10.1007/bf02666410
https://doi.org/10.1007/bf02666410
Publikováno v:
Materials Characterization. 30:55-60
In an effort to characterize interfacial microstructures in FeZn bimetallic couples, various techniques for the production of thin foils for examination with the transmission electron microscope (TEM) were developed. Microcrystalline arrays were o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0ddcc454903de2d9657ac06a81cf10f3
https://doi.org/10.1016/1044-5803(93)90008-j
https://doi.org/10.1016/1044-5803(93)90008-j
Autor:
L. A. Giannuzzi, Fred A. Stevie
Publikováno v:
Microscopy and Microanalysis. 20:294-295
FIB applications were initially driven by the silicon semiconductor industry and concentrated on preparation for SEM and modification of devices and masks. Development of TEM preparation coupled with the site specific capability provided by FIB signi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::03c7b3ae672427c1f058b6468846c932
https://doi.org/10.1017/s1431927614003195
https://doi.org/10.1017/s1431927614003195
Autor:
C. A. Lewinsohn, L. A. Giannuzzi
Publikováno v:
24th Annual Conference on Composites, Advanced Ceramics, Materials, and Structures: A: Ceramic Engineering and Science Proceedings
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6f522325022e83f052480a7ae3881b78
https://doi.org/10.1002/9780470294628.ch55
https://doi.org/10.1002/9780470294628.ch55
Autor:
C. A. Lewinsohn, L. A. Giannuzzi
Publikováno v:
23rd Annual Conference on Composites, Advanced Ceramics, Materials, and Structures: B: Ceramic Engineering and Science Proceedings
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2540746020e3a20651de8855260fedc8
https://doi.org/10.1002/9780470294574.ch14
https://doi.org/10.1002/9780470294574.ch14
Publikováno v:
Scripta Metallurgica et Materialia. 24:2407-2412
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::95fe52493a99aeb9da9b693fcb51188f
https://doi.org/10.1016/0956-716x(90)90102-m
https://doi.org/10.1016/0956-716x(90)90102-m
Publikováno v:
Microscopy research and technique. 41(4)
A site-specific technique for cross-section transmission electron microscopy specimen preparation of difficult materials is presented. A focused ion beam was used to slice an electron transparent membrane from a specific area of interest within a bul
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::0435f7430bb244756ac7b9aa295dcc6f
https://pubmed.ncbi.nlm.nih.gov/9633946
https://pubmed.ncbi.nlm.nih.gov/9633946