Zobrazeno 1 - 10
of 25
pro vyhledávání: '"L P. Ratliff"'
Autor:
M. Mantraga, H. Tawara, Nancy Brickhouse, D.A. Landis, E. E. Haller, Herbert W. Schnopper, L P. Ratliff, Norman W. Madden, J. M. Laming, John D. Gillaspy, Endre Takacs, Marco Barbera, Eric H. Silver, Jeffrey W. Beeman, K. Makonyi
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 205:144-155
The importance of the combination of electron beam ion trap (EBIT) spectroscopy with X-ray microcalorimeters in the field of astrophysics was discussed. X-ray astronomy involves heavily charged ion instruments , especially EBIT, to obtain improved qu
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 205:605-609
X-rays originating from a series of the cascades after electron capture into highly excited Rydberg states have been observed from low energy, highly charged Kr q + ions ( q =27–36) colliding with neutral Ar atoms. The intensity ratio between L ( n
Autor:
Ronaldo Minniti, J Pedulla, L P. Ratliff, Endre Takacs, Richard D. Deslattes, Z Berenyi, John D. Gillaspy, N Stolterfoht
Publikováno v:
Journal of Physics B: Atomic, Molecular and Optical Physics. 34:1277-1287
We have studied the spectrum of x-rays emitted when 130 and 200 keV kinetic energy hydrogen-like argon ions impact silicon dioxide surfaces. Specifically, we were interested in the mechanism for creation of K-shell holes in the silicon target atoms,
Publikováno v:
Physica Scripta. :22-26
Nanoscale dots created on the surface of a highly oriented pyrolitic graphite sample by individual highly charged xenon projectile ions were observed using an in-situ scanning tunneling microscope. This is the first time that such features have been
Autor:
E W. Bell, F. G. Serpa, Martin P. Stockli, L P. Ratliff, D. C. Parks, Robert W. Schmieder, John D. Gillaspy
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 134:46-52
We have measured the damage caused by the impact of low velocity, highly charged ions on insulating surfaces. Atomic force microscopy allows us to observe directly the surface topography with nanometer resolution. Using constant velocity (100 keV) Xe
Publikováno v:
Review of Scientific Instruments. 68:1998-2002
We describe our newly modified beam line and present its performance in conjunction with the National Institute of Standards and Technology electron-beam ion trap. We find that, contrary to previously reported results from similar ion sources, the hi
Publikováno v:
Journal of Physics B: Atomic, Molecular and Optical Physics. 30:289-308
We demonstrate a number of two-colour spectroscopy techniques where the first step is the photoassociation of laser-cooled and trapped sodium atoms to form bound states of . High-resolution spectra of are obtained. Spectra of the `purely long-range'
Publikováno v:
Hyperfine Interactions. 108:59-72
An overview is given of recent activities at the NIST electron beam ion trap (EBIT) facility. The machine has been operational for almost three years. Important characteristics and demonstrated capabilities of our EBIT are presented. Selected results
Publikováno v:
Journal of Physics B: Atomic, Molecular and Optical Physics. 29:L881-L888
Photodetachment from in a magnetic field has been studied experimentally using light with energies between 14400 and . Presented here are high-resolution data which exhibit sharp magnetic field structure at thresholds and low-resolution data which sh
Publikováno v:
Review of Scientific Instruments. 67:2528-2533
The design and operation of a beam line for transporting and charge‐to‐mass selecting highly charged ions extracted from the National Institute of Standards and Technology electron beam ion trap (EBIT) are described. This beam line greatly extend