Zobrazeno 1 - 10
of 89
pro vyhledávání: '"L L Madsen"'
Publikováno v:
Journal of Microscopy. 178:86-92
The correlation averaging algorithm frequently used to enhance micrographs of repeating structures contains an inherent bias that favours images with larger pixel values or positive noise levels. This bias not only skews the composite image toward hi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1a0d7303507c9146618c8be12cc11cea
https://doi.org/10.1111/j.1365-2818.1995.tb03583.x
https://doi.org/10.1111/j.1365-2818.1995.tb03583.x
Autor:
John T. Woodward, Joseph A. Zasadzinski, Marjorie L. Longo, Daniel K. Schwartz, Shivkumar Chiruvolu, R. Viswanathan, L. L. Madsen, Jørgen Garnæs
Publikováno v:
Colloids and Surfaces A: Physicochemical and Engineering Aspects. 93:305-333
The atomic force microscope (AFM) has created exciting new possibilities for imaging thin organic films under ambient conditions at length scales ranging from tens of microns to the sub-molecular scale. We present images of thin organic films prepare
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::787a28f20885bad95dd7f158388fee23
https://doi.org/10.1016/0927-7757(94)80002-2
https://doi.org/10.1016/0927-7757(94)80002-2
Publikováno v:
Science. 263:1726-1733
The controlled transfer of organized monolayers of amphiphilic molecules from the airwater interface to a solid substrate was the first molecular-scale technology for the creation of new materials. However, the potential benefits of the technology en
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::86b566b2b68f5b51e3046e32044ac59c
https://doi.org/10.1126/science.8134836
https://doi.org/10.1126/science.8134836
Publikováno v:
Metrologia. 30:513-516
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9d2b65c87bf8cae52df40065c53b808e
https://doi.org/10.1088/0026-1394/30/5/009
https://doi.org/10.1088/0026-1394/30/5/009
Publikováno v:
Nanotechnology. 4:152-158
Scanning tunneling microscopes (STMS), which are now available in several commercial versions, are well suited to produce topographic pictures of areas up to 100*100 mu m2 from electrical conducting surfaces. The authors present two examples of its u
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3d686bd521947c1df57433d7ef987369
https://doi.org/10.1088/0957-4484/4/3/004
https://doi.org/10.1088/0957-4484/4/3/004
Autor:
L L, MADSEN, I P, EARLE
Publikováno v:
Federation proceedings. 6(1)
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::a77ddc77345e5134b5db6550088952a9
https://pubmed.ncbi.nlm.nih.gov/20343877
https://pubmed.ncbi.nlm.nih.gov/20343877
Publikováno v:
Journal of animal science. 6(3)
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a6236c46183c1811f441f4664f8d5a76
https://pubmed.ncbi.nlm.nih.gov/20258837
https://pubmed.ncbi.nlm.nih.gov/20258837
Publikováno v:
MRS Proceedings. 332
The Atomic Force Microscope (AFM) has created exciting new possibilities for imaging thin organic films under ambient conditions at length scales ranging from tens of microns to the sub - molecular scale. We present images of thin organic films prepa
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3a4960c9c42c53e939b2537168524404
https://doi.org/10.1557/proc-332-429
https://doi.org/10.1557/proc-332-429
Publikováno v:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 12:1698
A new automated technique for the estimation of the lateral calibration factors and for the drift in the fast scanning direction of SXM instruments is introduced. It is based on the detection of the reciprocal unit cell in Fourier space. The estimate
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b7ac75928d76162e4cd2d332a3bbbd5e
https://doi.org/10.1116/1.587266
https://doi.org/10.1116/1.587266
Publikováno v:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 12:1702
The hysteresis of the scanning elements in STM are known to cause geometrically distorted images. By analyzing the traces and retraces of the tip, the hysteresis can be quantified and a general model describing the hysteresis can be constructed. That
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::43033cb9e155183cf450198ea781421c
https://doi.org/10.1116/1.587267
https://doi.org/10.1116/1.587267