Amplitude mode of charge density wave in TTF[Ni(dmit)2]2 observed by electronic Raman scattering

Autor: Yann Gallais, M. Revelli Beaumont, D. de Caro, Alain Sacuto, C. Faulmann, Maximilien Cazayous, Kane Jacob, L. Valade

Publikováno v: Physical Review B. 103

We measured the optical signature of charge density waves (CDWs) in the multiband conductor $\mathrm{TTF}{[\mathrm{Ni}{(\mathrm{dmit})}_{2}]}_{2}$ by electronic Raman scattering. At low energies, a hump develops below 60 K. This hump is associated to

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::41a2b91abfe5276dcdb7c6c98fc1d250
https://doi.org/10.1103/physrevb.103.035139

Electron burst driven by near electric field effects of lower-hybrid launchers

Autor: E. Caschera, S. Lepri, G. Latu, Yanick Sarazin, H. Bufferand, A. Ekedahl, Xavier Garbet, Philippe Ghendrih, P. Di Cintio, L. Valade, Roberto Livi, Anne Nouri, V. Grandgirard, P. Donnel, G. Ciraolo, P.-A Giorgi, G. Dif-Pradalier, Eric Serre, Yuuichi Asahi

Publikováno v: Contributions to Plasma Physics
Contributions to Plasma Physics, Wiley-VCH Verlag, 2018, 58 (6-8), pp.465-470. ⟨10.1002/ctpp.201700156⟩
Contributions to Plasma Physics, 2018, 58 (6-8), pp.465-470. ⟨10.1002/ctpp.201700156⟩
Contributions to plasma physics (1985) 58 (2018): 465–470. doi:10.1002/ctpp.201700156
info:cnr-pdr/source/autori:Valade L.; Ekedahl A.; Ghendrih P.; Sarazin Y.; Asahi Y.; Bufferand H.; Caschera E.; Di Cintio P.; Ciraolo G.; Dif-Pradalier G.; Donnel P.; Garbet X.; Giorgi P.-A.; Grandgirard V.; Latu G.; Lepri S.; Livi R.; Nouri A.; Serre E./titolo:Electron burst driven by near electric field effects of lower-hybrid launchers/doi:10.1002%2Fctpp.201700156/rivista:Contributions to plasma physics (1985)/anno:2018/pagina_da:465/pagina_a:470/intervallo_pagine:465–470/volume:58

International audience; Hotspot generation by lower-hybrid (LH) launchers is found to be governed by a resonance in the plasma electric field response to the external drive. The kinetic analysis in 1D-1V in the parallel direction allows one to comput

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::66154d77565c89ff45fe8a42c952cf3d
https://hal-amu.archives-ouvertes.fr/hal-02116142

Process modeling with neural networks using small experimental datasets

Autor: J. L. Valade, Jules Thibault, Robert Lanouette

Publikováno v: Computers & Chemical Engineering. 23:1167-1176

This paper reports some work done to improve the modeling of complex processes when only small experimental data sets are available. Various solution strategies based on feed-forward and radial basis function (RBF) neural networks have been tested fo

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::f7ad1dc53774b8758af3fd508da121a9
https://doi.org/10.1016/s0098-1354(99)00282-3

Optimization of an alkaline peroxide interstage treatment of jack pine (Pinus banksiana lamb.) using a D-optimal design

Autor: J. L. Valade, Robert Lanouette, Jules Thibault

Publikováno v: The Canadian Journal of Chemical Engineering. 75:70-78

For many decades, the utilization of jack pine in the pulp and paper industry has attracted considerable interest but without any major breakthrough. However, in the past few years the emergence of new technologies has provided hope for its potential

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::1e40e18ed2b1e6ddb89e5f06605315a8
https://doi.org/10.1002/cjce.5450750113

A composite representation of pulp quality

Autor: Gordon Broderick, J. L. Valade, J. Paris

Publikováno v: Chemometrics and Intelligent Laboratory Systems. 29:19-28

Principal component analysis (PCA) performed on data from pilot scale chemimechanical (CMP) pulping trials indicates that over 90% of the variation in 11 handsheet properties can be expressed in terms of only 4 composite variables. The relaionships b

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::dc120f68b8291df4e6a3498647650251
https://doi.org/10.1016/0169-7439(95)80076-l