Zobrazeno 1 - 10
of 40
pro vyhledávání: '"KyungSeok Oh"'
Autor:
Kyungseok Oh, Junho Kim
Publikováno v:
Machines, Vol 12, Iss 9, p 633 (2024)
Cavitation phenomena in pumps are major determinants of the lifespan of both the impeller and the pump itself, causing significant vibration and noise, which are critical concerns for pump designers. This study focuses on the influence of various geo
Externí odkaz:
https://doaj.org/article/95cf21fb26a84f5db3d84869cb114383
Publikováno v:
Journal of Korea Robotics Society. 16:336-344
Autor:
Hong-Woo Lee, Do-Nyun Kim, Yeon-Sik Kang, Sungsoo Park, Kyungseok Oh, Jaehyun Kim, Dong-Yoon Seok
Publikováno v:
Journal of Materials Processing Technology. 289:116929
The yield-point phenomenon (YPP) is generally eliminated or reduced in aged sheet metals to avoid defects during metal forming applications; however, it may be beneficial in specific applications and could be induced to enhance certain properties. Fo
Autor:
Kyungseok Oh, Seon Yoon Jung, Kyeonghui Kim, Sang Hyeon Jin, Jinung An, Sanghyun Won, Gi Hyun Lee, Janghwan Jekal, Inhwa Han, Seung Tae Yang, Yungeui Kang
Publikováno v:
2018 6th International Conference on Brain-Computer Interface (BCI).
Until recently, pain assessment has largely relied on subjective self-reports such as questionnaires or VAS. This paper attempts to objectively quantify pain from a neurological point of view through the characteristics of cerebral hemodynamics. Func
Autor:
Kyungseok Oh
Publikováno v:
Seoul Tax Law Review. 21:409-439
Autor:
Yong-Han Roh, Seung-Heon Lee, Kyungseok Oh, Jung-Chan Lee, Jun-Hee Lee, Mun-jun Kim, Seok-Woo Nam, Seung-jae Lee, Mansug Kang
Publikováno v:
ECS Transactions. 33:53-58
We studied the misalignment between active and gate layer in terms of silicon dislocation caused by high temperature anneal process in SOG based STI gap-fill process. The SOG process is one of good candidates to overcome gap-fill limitation due to it
Autor:
Hui-jung Kim, Hyun-Gi Kim, Young-Hyun Jun, Gyo-Young Jin, Donggun Park, Jin-Young Kim, Jae-Man Yoon, Sua Kim, Ki-whan Song, Jei-Hwan Yoo, Hyun-Chul Kang, Chang-Hyun Kim, Duk-ha Park, Hwan-Wook Park, Kang-Uk Kim, Yeong-Taek Lee, Woo-Seop Kim, Nam-Kyun Tak, Kyungseok Oh, Yong Chul Oh, Hyun-Woo Chung
Publikováno v:
IEEE Journal of Solid-State Circuits. 45:880-888
A functional 4F2 DRAM was implemented based on the technology combination of stack capacitor and surrounding-gate vertical channel access transistor (VCAT). A high performance VCAT has been developed showing excellent Ion-Ioff characteristics with mo
Autor:
Hyeongsun Hong, Don Park, Chang-Suk Hyun, Kyungseok Oh, Seong-Goo Kim, Tai-heui Cho, Jong-Gyu Suk, Kang-yoon Lee
Publikováno v:
Solid-State Electronics. 50:1030-1034
Fully integrated 512 Mb DRAMs with hemispherical grain (HSG) merged Al2O3/HfO2 (AHO) cylinder capacitor were successfully developed for the first time. Highly manufacturable reverse HSG one cylinder storage node (RHOCS) technique and AHO capacitor pr
Autor:
Soo-Young Park, Young Gyu Kim, Barry L. Farmer, Seung-Yeop Kwak, Jong-Chan Lee, Kyungseok Oh, Jae Young Jho, Hee Bong Lee
Publikováno v:
Macromolecular Rapid Communications. 22:815-819
[(6-Heptylsulfonyl)hexylthio]methyl-substituted poly(oxyethylene) bearing a very polar sulfone group in the middle of the alkyl side chain was success fully synthesized by the reaction of poly[oxy(chloromethyl)ethylene] and (6-heptylsulfonyl)hexyl th
Autor:
Mi-Jo Kim, Jung-Bae Lee, Jae-Youn Youn, Joon-Young Park, Sang-Hoon Jung, Sung-Min Yim, Seung Bum Ko, Hyo-Chang Kim, Joo Sun Choi, Jeong Yong-Gwon, Hyunyoon Cho, Sang Jae Rhee, Kyungseok Oh, Dae-Sik Yim, Yong-Cheol Bae, Young Hoon Son, Yong-Gyu Chu, Hye-In Choi, Kwang-Sook Noh
Publikováno v:
ISSCC
Mobile DRAM is widely adopted in battery-powered portable devices because of its low power. Recently, in mobile devices such as smart phones and tablet PCs, higher performance is required to support 3D gaming mode and high-quality video. These trends