Zobrazeno 1 - 10
of 15
pro vyhledávání: '"Kyung-youl Min"'
Autor:
Choul-Ho Lim, Kyung-youl Min, Yil-Wook Kim, Kwang-Jun Cho, Soun-Young Lee, Sung Heo, Ho-Joung Kim, Yoon-Baek Park, Tae-Kwon Lee, Moon-Keun Ichon Lee
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 19:916-921
The SrBi2Ta2O9 (SBT) films studied for this report were prepared by metalorganic decomposition. The SBT thin film, which belongs to a Bi-layered perovskite structure where double Ta–O octahedron layers are sandwiched between (Bi2O2)2+ layers, was a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3ea324fd1ef645c276017e8909813993
https://doi.org/10.1116/1.1354601
https://doi.org/10.1116/1.1354601
Publikováno v:
SHINKU. 40:313-316
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::05b3fc6de71a3f71586f4607dd6fd59f
https://doi.org/10.3131/jvsj.40.313
https://doi.org/10.3131/jvsj.40.313
Autor:
Kyung-youl Min, Ryuichi Shimizu
Publikováno v:
Surface Science. 341:241-248
To understand the basic processes of altered layer formation in subsurface regions of an alloy, we studied the dynamic change of the composition profile in the altered layer by Monte Carlo simulation. The simulation was performed for Cu52Pt alloy und
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d3acfc9eaf040408b9be2feb1916bd31
https://doi.org/10.1016/0039-6028(95)00686-9
https://doi.org/10.1016/0039-6028(95)00686-9
Publikováno v:
Journal of the Japan Welding Society. 64:277-281
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3cb4c60f1cf8106910a3920a91ecd785
https://doi.org/10.2207/qjjws1943.64.277
https://doi.org/10.2207/qjjws1943.64.277
Autor:
Kyung-youl Min, Dae Won Moon, Hyo Sik Chang, Sangmu Choi, Hyunsang Hwang, Hyung-Ik Lee, Hyundoek Yang
Publikováno v:
Applied Physics Letters. 80:386-388
The electrical and structural characteristics of an ultrathin gate dielectric, thermally grown on 4° tilted wafer has been investigated. Compared with a control wafer, a relaxation of the Si lattice strain at the SiO2/Si(001) interface was observed
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e8a68215afba8f51b6029dba98a463a0
https://doi.org/10.1063/1.1435404
https://doi.org/10.1063/1.1435404
Autor:
Kyung-Youl Min, John Garcia, Christophe Suzor, Victor V. Boksha, Mitch Heins, Rafik Marutyan, Anthony Adamov, John Gookassian, Sergei Bakarian, Gurgen Lachinyan, Hitendra Divecha, Bob Pack, Dean Frazier, Brian Gordon, Dan White, Brian Dillon
Publikováno v:
Design and Process Integration for Microelectronic Manufacturing III.
There is a growing realization of the need for highly integrated solutions enabled by new bi-directional data 'pipes' between design and manufacturing. Traditional EDA applications should be able to communicate and collaborate with yield analysis sof
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2feb8b6b5ef1bbbf5f1bd206a9b821e6
https://doi.org/10.1117/12.600261
https://doi.org/10.1117/12.600261
Autor:
Riichirou Mitsuhashi, Yoshihiro Irokawa, Suchan Lee, Yoshihide Kimura, Kyung-youl Min, Ryuichi Shimizu, Masahiko Inoue
Publikováno v:
Japanese Journal of Applied Physics. 35:4042
The surface structure of Zr–O/W(100) at 1700 K was studied by reflection high-energy electron diffraction and ion scattering spectroscopy. It has been revealed that Zr atoms align themselves to form p(1×1) structure in the topmost atomic layer of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d7c20a68d9c374e4589f728aef7cc8e9
https://doi.org/10.1143/jjap.35.4042
https://doi.org/10.1143/jjap.35.4042
Autor:
Ryuichi Shimizu, Siegfried Hohmann, Yosuke Suzuki, Masahiko Inoue, Riichirou Mitsuhashi, Kyung–youl Min
Publikováno v:
Japanese Journal of Applied Physics. 35:221
We have developed an ultrahigh-vacuum (UHV) apparatus which enables reflection high-energy electron diffraction (RHEED), sputtering yield measurement and ion scattering spectroscopy (ISS) to be performed simultaneously, leading to a more comprehensiv
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1d8602adbecdeb01c316b719368262cb
https://doi.org/10.1143/jjap.35.221
https://doi.org/10.1143/jjap.35.221
Publikováno v:
Japanese Journal of Applied Physics. 33:6675
The `over-cosine' distribution peculiar to the angular distribution of Pt atoms sputtered from pure Pt and Cu-Pt (19 at.%) alloy targets has been studied experimentally and theoretically. The angular distributions were measured for pure Cu, Pt and Cu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::92c0744779c0a8356b1e328e21abce53
https://doi.org/10.1143/jjap.33.6675
https://doi.org/10.1143/jjap.33.6675
Publikováno v:
Japanese Journal of Applied Physics. 33:3566
A (100)-oriented TiN film was successfully prepared by means of the post irradiation of the 5 keV N2 + ion beam onto the predeposited titanium film ∼500 Å thick on a Si(001) substrate at room temperature. The crystal growth of TiN film was monitor
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5ec35e48b76289e94603e53cfbfe9493
https://doi.org/10.1143/jjap.33.3566
https://doi.org/10.1143/jjap.33.3566