Zobrazeno 1 - 10
of 27
pro vyhledávání: '"Kyung-Chae Yang"'
Autor:
Jeong Hoon Ahn, Min Guk Kang, Hyun Woo Tak, Jun Ki Jang, Ye Ji Shin, Jae Young Hyeon, Geun Young Yeom, Kyung Chae Yang
Publikováno v:
ECS Transactions. 89:79-86
Autor:
Soo-Gang, Kim, Kyung-Chae, Yang, Ye-Ji, Shin, Kyong-Nam, Kim, Dong-Woo, Kim, Jeong Yub, Lee, YeonHee, Kim, Geun-Young, Yeom
Publikováno v:
Nanotechnology. 31(26)
The etch characteristics of Si and TiO
Publikováno v:
Nanotechnology. 30(28)
We demonstrate plasma-treated Ag nanowires (NWs) as flexible transparent electrode materials with enhanced long-term stability against oxidation even in a high humidity environment (80% humidity, 20 °C). Through a simple fluorocarbon (C
Publikováno v:
Science of Advanced Materials. 8:2253-2259
Autor:
Min Hwan Jeon, Viet Phuong Pham, Geun Young Yeom, Tae Hun Shim, Du Yeong Lee, Sung Woo Park, Kyung Chae Yang, Jea-Gun Park
Publikováno v:
Vacuum. 127:82-87
The effect of different bias frequencies during the etching of magnetic tunneling junction materials in an inductively coupled plasma with rf pulse biasing (50% duty percentage) on etch characteristics was investigated. The decrease of rf bias freque
Autor:
Viet Phuong Pham, Doo San Kim, Ki Seok Kim, Jin Woo Park, Kyung Chae Yang, Se Han Lee, Geun Young Yeom, Kyong Nam Kim
Publikováno v:
Science of Advanced Materials. 8:884-890
Autor:
Kyung-Chae Yang, Kyongnam Kim, Soo-Gang Kim, Jeong Yub Lee, Ye-Ji Shin, Yeon-hee Kim, Geun Young Yeom, Dongwoo Kim
Publikováno v:
Nanotechnology. 31:265302
The etch characteristics of Si and TiO2 nanostructures for optical devices were investigated using pulse biased inductively coupled plasmas (ICP) with SF2/C4F8/Ar and BCl3/Ar, respectively, and the results were compared with those etched using contin
Publikováno v:
Journal of the Korean institute of surface engineering. 48:360-370
As the size of the semiconductor devices shrinks to nanometer scale, the importance of plasma etching process to the fabrication of nanometer scale semiconductor devices is increasing further and further. But for the nanoscale devices, conventional p
Publikováno v:
Vacuum. 121:294-299
The characteristics of a synchronized pulse plasma using 60 MHz radio frequency as a source power and 2 MHz radio frequency as a bias power were investigated for the etching of SiO 2 masked with an amorphous carbon layer (ACL) in a C 4 F 8 /Ar/O 2 ga
Autor:
Min Hwan Jeon, Geun Young Yeom, Deok Hyun Yun, Ji Youn Youn, Kyung Chae Yang, Jea-Gun Park, Tae Hun Shim, Du Yeong Lee
Publikováno v:
Journal of Nanoscience and Nanotechnology. 14:9541-9547
The etch characteristics of magnetic tunneling junction (MTJ) related materials such as CoFeB, MgO, FePt, Ru, and W as hard mask have been investigated as functions of rf pulse biasing, substrate heating, and CH4/N2O gas combination in an inductively