Zobrazeno 1 - 10
of 19
pro vyhledávání: '"Kyung Yeol Kim"'
Autor:
Byung Jo Choi, Min Hee Park, Kang Ho Park, Wan Hui Han, Hee Ji Yoon, Hye Yoon Jung, Ju Yeon Hong, Md Riad Chowdhury, Kyung Yeol Kim, Jihoon Lee, Im-Sook Song, Minyeong Pang, Min-Koo Choi, Erich Gulbins, Martin Reichel, Johannes Kornhuber, Chang-Won Hong, Changho Kim, Seung Hyun Kim, Edward H. Schuchman, Hee Kyung Jin, Jae-sung Bae
Publikováno v:
Nature Communications, Vol 14, Iss 1, Pp 1-17 (2023)
Acid sphingomyelinase (ASM) is a sphingolipid metabolizing enzyme that catalyzes the hydrolysis of sphingomyelin to ceramide, and previous work has shown it is upregulated in models of Alzheimer’s disease. Here the authors demonstrate in a mouse mo
Externí odkaz:
https://doaj.org/article/52c99cf51ae64f39b52ec19ee7f53cf4
Publikováno v:
2022 International Conference on Electronics Packaging (ICEP).
Publikováno v:
2022 International Conference on Electronics Packaging (ICEP).
Publikováno v:
2022 IEEE 72nd Electronic Components and Technology Conference (ECTC).
Publikováno v:
2022 IEEE 72nd Electronic Components and Technology Conference (ECTC).
Publikováno v:
Science of Advanced Materials. 12:525-530
The microstructures and mechanical reliability of Sn–58Bi solder and epoxy Sn–58Bi composite solder joint were investigated with organic solderability preservative surface finishes. The mechanical reliabilities of Sn58Bi and epoxy Sn58Bi solder w
Publikováno v:
Journal of Nanoscience and Nanotechnology. 18:6316-6320
Microstructures and mechanical property of Sn-3.0Ag-0.5Cu (SAC305) and epoxy Sn-3.0Ag-0.5Cu (epoxy SAC) solder joints were investigated with various surface finishes; organic solderability preservative (OSP), electroless nickel immersion gold (ENIG)
Publikováno v:
Journal of Nanoscience and Nanotechnology. 17:7497-7501
Publikováno v:
Nanoscience and Nanotechnology Letters. 9:1202-1206
Publikováno v:
Journal of Materials Science: Materials in Electronics. 28:16467-16475
We investigated the mechanical property of Cu–Cu joints bonded using an ultrasonic bonding and evaluated the reliability of 3D structure stacked by through silicon via (TSV) on glass substrate. TSV was fabricated by using the deep reactive ion etch