Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Kyosuk Chae"'
Autor:
Hyewon Seo, Taiuk Rim, Eunsun Lee, Sekyoung Jang, Kyosuk Chae, Jeonghoon Oh, Hyodong Ban, Jooyoung Lee
Publikováno v:
2023 IEEE International Reliability Physics Symposium (IRPS).
Autor:
Hyunho Park, Sang-Yeon Han, Won-Seok Lee, Chang-Hoon Jeon, Siok Sohn, Kyosuk Chae, Yamada, S., Wouns Yang, Donggun Park
Publikováno v:
2007 IEEE International Conference on Microelectronic Test Structures; 2007, p55-58, 4p
Publikováno v:
2010 IEEE International Integrated Reliability Workshop Final Report (IRW); 2010, p161-163, 3p