Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Kyle M. Winter"'
Autor:
Edward S. Hermann, John Carulli, Carmelo F. Scrudato, Steven B. Herschbein, Kyle M. Winter, Brian Yates
Publikováno v:
International Symposium for Testing and Failure Analysis.
Focused Ion Beam (FIB) chip circuit editing is a well-established highly specialized laboratory technique for making direct changes to the functionality of integrated circuits. A precisely tuned and placed ion beam in conjunction with process gases s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4393088a11014e675c6da4e7ad89a1bf
https://doi.org/10.31399/asm.cp.istfa2020p0122
https://doi.org/10.31399/asm.cp.istfa2020p0122
Publikováno v:
International Symposium for Testing and Failure Analysis.
Focused Ion Beam (FIB) circuit edit allows for rapid prototyping of potential semiconductor design changes without the need to run a full manufacturing cycle in a semiconductor Fab. By FIB editing a completed module, thorough testing on the bench or
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::47c830415e7ec74bb60db28561c3363c
https://doi.org/10.31399/asm.cp.istfa2019p0204
https://doi.org/10.31399/asm.cp.istfa2019p0204