Zobrazeno 1 - 10
of 18
pro vyhledávání: '"Kyle, Godin"'
Autor:
David Douglass, Kyle Godin
Publikováno v:
EDFA Technical Articles. 25:4-8
Broad ion beam delayering is a versatile technique for whole-chip failure analysis. The large area of uniformity coupled with the ability to precisely stop at the layer of interest facilitates repeatable, rapid defect detection anywhere on the chip.
Publikováno v:
Optics express. 30(8)
The field of ultraviolet (UV)-laser applications is currently experiencing rapid growth in the semiconductor processing, laser micromachining and biomedical markets. Key enablers for these technologies are optical coatings used to manipulate and guid
The field of ultraviolet (UV)-laser applications is currently experiencing rapid growth in the semiconductor processing, laser micromachining and biomedical markets. Key enablers for these technologies are optical coatings used to manipulate and guid
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ecd3ebc5f165699e3f1673ae739f4011
https://publica.fraunhofer.de/handle/publica/427187
https://publica.fraunhofer.de/handle/publica/427187
Publikováno v:
Optical Interference Coatings Conference (OIC) 2022.
We investigate how target selection, ion beam parameters, and post-deposition annealing can affect UV performance of ion beam sputtered optical coatings. We combine these considerations to produce high performance HR mirrors at 355 nm.
Publikováno v:
Optical Interference Coatings Conference (OIC) 2019.
Applications of monochromatic and broadband optical monitoring methods for deposition of different types of bandpass filters are considered. We demonstrate how optical monitoring system performance can be matched to filter specifications.
Publikováno v:
Micro- and Nanotechnology Sensors, Systems, and Applications X.
This paper presents a review of the controlled growth of transition metal dichalcogenide (TMD) heterostructures, and the elucidation of the role of underlying two dimensional (2D) materials on temporal degradation of transition metal dichalcogenides
Publikováno v:
Scientific Reports, Vol 7, Iss 1, Pp 1-11 (2017)
A model has been developed to account for and prevent the anomalies encountered in topographic images of transition metal dichalcogenide monolayers using dynamic atomic force microscopy (dAFM). The height of WS2 monolayers measured using dAFM appeare
Publikováno v:
Scientific Reports
A model has been developed to account for and prevent the anomalies encountered in topographic images of transition metal dichalcogenide monolayers using dynamic atomic force microscopy (dAFM). The height of WS2 monolayers measured using dAFM appeare
Autor:
Kyungnam Kang, Wujoon Cha, Young Duck Kim, Eui-Hyeok Yang, James Hone, Shichen Fu, Kyle Godin
Publikováno v:
Advanced Materials. 29
Publikováno v:
Journal of Vacuum Science & Technology B. 37:052902
The poly(methyl methacrylate) (PMMA)-assisted wet transfer is a commonly used method to transfer chemical vapor deposition (CVD)-grown transition metal dichalcogenides (TMDs) onto another substrate. However, the transferred TMDs often show heavy phot