Zobrazeno 1 - 10
of 45
pro vyhledávání: '"Kyeong Suk Kim"'
Publikováno v:
Nuclear Engineering and Technology, Vol 52, Iss 4, Pp 856-862 (2020)
Defect inspection system for industrial applications takes the important portion. Non-destructive inspection method has been significantly improved. Infrared thermography, as one of method for non-destructive inspection, can provide relatively precis
Externí odkaz:
https://doaj.org/article/73ec23a69e4d442991d6b9b7f38abe94
Publikováno v:
Nuclear Engineering and Technology, Vol 46, Iss 2, Pp 225-234 (2014)
Wall-thinned defects caused by accelerated corrosion due to fluid flow in the inner pipe appear in many structures of the secondary systems in nuclear power plants (NPPs) and are a major factor in degrading the integrity of pipes. Wall-thinned defect
Externí odkaz:
https://doaj.org/article/119b091dd66d4a7397b022c1f66812ac
Autor:
Kyeong-Suk Kim, Chan-Geun Kang, Jae-Geun Song, Hang-Seo Lee, Hyun-Il Jung, Hyun-Chul Jung, Han-Sub Kim, Sang Chae Kim
Publikováno v:
The Korean Society of Manufacturing Process Engineers. 20:39-48
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6cb1fb556fc899e3e3e6f3892a0d2d61
https://doi.org/10.14775/ksmpe.2021.20.04.039
https://doi.org/10.14775/ksmpe.2021.20.04.039
Publikováno v:
JOURNAL OF THE KOREAN SOCIETY FOR NONDESTRUCTIVE TESTING. 40:9-15
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d8105b1ecd7f539c92d2a79324f6698d
https://doi.org/10.7779/jksnt.2020.40.1.9
https://doi.org/10.7779/jksnt.2020.40.1.9
Publikováno v:
The Korean Society of Manufacturing Process Engineers. 18:44-51
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::dc42324dac2af84949dbd58a38f12523
https://doi.org/10.14775/ksmpe.2019.18.9.044
https://doi.org/10.14775/ksmpe.2019.18.9.044
Publikováno v:
JOURNAL OF THE KOREAN SOCIETY FOR NONDESTRUCTIVE TESTING. 39:75-88
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e49d3b92fca88419a20eabdb947b2acb
https://doi.org/10.7779/jksnt.2019.39.2.75
https://doi.org/10.7779/jksnt.2019.39.2.75
Publikováno v:
JOURNAL OF THE KOREAN SOCIETY FOR NONDESTRUCTIVE TESTING. 38:91-97
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c0915daeee7d72d3c952e90ad80e17fd
https://doi.org/10.7779/jksnt.2018.38.2.91
https://doi.org/10.7779/jksnt.2018.38.2.91
Publikováno v:
JOURNAL OF THE KOREAN SOCIETY FOR NONDESTRUCTIVE TESTING. 37:158-163
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::42b12578031894e0101c3e56a4c92601
https://doi.org/10.7779/jksnt.2017.37.3.158
https://doi.org/10.7779/jksnt.2017.37.3.158
Autor:
Yong Jai Cho, Dong Soo Kim, Se-Hwan Paek, Kyeong-Suk Kim, Won Chegal, Mangesh S. Diware, Hyun Mo Cho, Sang Won O
Publikováno v:
Biosensors and Bioelectronics. 87:242-248
Acute myocardial infarction (MI) is the leading cause of high mortality and morbidity rate worldwide, early and accurate diagnosis can increase the chances of survival. In this work, we report a simple, ultrasensitive, label-free, and high-throughput
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::aba86b4f52874e1773f2f5dcdf6fea56
https://doi.org/10.1016/j.bios.2016.08.049
https://doi.org/10.1016/j.bios.2016.08.049
Autor:
Ju Yeop Shin, Chung Ki Hong, Ik-Hwan Kwon, Sung Hoon Kang, Kyeong Suk Kim, Hyun-Chul Jung, Seung Pil Yang, Hye Joon Ma
Publikováno v:
Journal of the Korean Society for Nondestructive Testing. 36:18-26
The semiconductor industry is one of the key industries of Korea, which has continued growing at a steady annual growth rate. Important technology for the semiconductor industry is high integration of devices. This is to increase the memory capacity
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::17934a2e6aceefadfca41d842aa962fa
https://doi.org/10.7779/jksnt.2016.36.1.18
https://doi.org/10.7779/jksnt.2016.36.1.18