Zobrazeno 1 - 10
of 10
pro vyhledávání: '"Kyehyun Kyung"'
Publikováno v:
Samsung Electronics Co., Ltd. MarketLine Company Profile. 9/23/2024, p1-124. 124p.
Autor:
Jung-Sik Kim, Chi Sung Oh, Hocheol Lee, Donghyuk Lee, Hyong-Ryol Hwang, Sooman Hwang, Byongwook Na, Joungwook Moon, Jin-Guk Kim, Hanna Park, Jang-Woo Ryu, Kiwon Park, Sang-Kyu Kang, So-Young Kim, Hoyoung Kim, Jong-Min Bang, Hyunyoon Cho, Minsoo Jang, Cheolmin Han, Jung-Bae Lee, Kyehyun Kyung, Joo-Sun Choi, Young-Hyun Jun
Publikováno v:
2011 IEEE International Solid-State Circuits Conference.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c3038919abd2d77f23dead834dde358a
https://doi.org/10.1109/isscc.2011.5746413
https://doi.org/10.1109/isscc.2011.5746413
Publikováno v:
Samsung Electronics Co., Ltd. MarketLine Company Profile. 11/14/2023, p1-114. 114p.
Autor:
Chulbum Kim, Jinho Ryu, Taesung Lee, Hyeonggon Kim, Jeawoo Lim, Jaeyong Jeong, Seonghwan Seo, Hongsoo Jeon, Bokeun Kim, InYoul Lee, DooSeop Lee, PanSuk Kwak, Seongsoon Cho, Yongsik Yim, Changhyun Cho, Woopyo Jeong, Jin-Man Han, Dooheon Song, Kyehyun Kyung, Young-Ho Lim
Publikováno v:
2011 Symposium on VLSI Circuits (VLSIC); 2011, p196-197, 2p
Autor:
Hyunggon Kim, Jung-hoon Park, Ki-Tae Park, Pansuk Kwak, Ohsuk Kwon, Chulbum Kim, Younyeol Lee, Sangsoo Park, Kyungmin Kim, Doohyun Cho, Juseok Lee, Jungho Song, Soowoong Lee, Hyukjun Yoo, Sanglok Kim, Seungwoo Yu, Sungjun Kim, Sungsoo Lee, Kyehyun Kyung, Yong-Ho Lim
Publikováno v:
2010 IEEE International Solid-State Circuits Conference Digest of Technical Papers (ISSCC); 2010, p442-443, 2p
Publikováno v:
Samsung Electronics Co., Ltd. MarketLine Company Profile. 9/20/2022, p1-103. 103p.
Publikováno v:
ACM Transactions on Embedded Computing Systems; Jan2022, Vol. 21 Issue 1, p1-22, 22p
Autor:
Kim, Chulbum, Ryu, Jinho, Lee, Taesung, Kim, Hyunggon, Lim, Jaewoo, Jeong, Jaeyong, Seo, Seonghwan, Jeon, Hongsoo, Kim, Bokeun, Lee, Inyoul, Lee, Dooseop, Kwak, Pansuk, Cho, Seongsoon, Yim, Yongsik, Cho, Changhyun, Jeong, Woopyo, Park, Kwangil, Han, Jin-Man, Song, Duheon, Kyung, Kyehyun
Publikováno v:
IEEE Journal of Solid-State Circuits; Apr2012, Vol. 47 Issue 4, p981-989, 9p