Zobrazeno 1 - 9
of 9
pro vyhledávání: '"Kwakman, Laurens"'
Autor:
Huang, J., Löffler, Markus, Mühle, Uwe, Möller, Wolfhard, Mulders, Johannes J.L., Kwakman, Laurens, Dorp, Willem F. van, Zschech, Ehrenfried
Publikováno v:
Ultramicroscopy 184(2018), 52-56
A Ga focused ion beam (FIB) is often used in transmission electron microscopy (TEM) analysis sample preparation. In case of a crystalline Si sample, an amorphous near-surface layer is formed by the FIB process. In order to optimize the FIB recipe by
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::e7a5c0a2990e312db71d55b867724722
https://www.hzdr.de/publications/Publ-26661-1
https://www.hzdr.de/publications/Publ-26661-1
Autor:
Johanesen, Hayley, Strauss, Michael, Kenslea, Anne, Hakala, Chris, Kwakman, Laurens, Boullart, Werner, Mertens, Hans, Yong Kong Siew, Barla, Kathy
Publikováno v:
Proceedings of SPIE; 1/22/2019, Vol. 10959, p1-9, 9p
Autor:
Kwakman, Laurens, Kenslea, Anne, Johanesen, Hayley, Cramer, Jillian, Strauss, Michael, Boullart, Werner, Mertens, Hans, Yong Kong Siew, Barla, Kathy
Publikováno v:
Proceedings of SPIE; 1/22/2019, Vol. 10959, p1-14, 14p
Autor:
Latu-Romain, Eddy, Mermoux, Michel, Crisci, Alexandre, Delille, Dominique, Kwakman, Laurens F. Tz.
Publikováno v:
Journal of Applied Physics; Nov2007, Vol. 102 Issue 10, p103506, 8p, 2 Diagrams, 6 Graphs
Autor:
Ukraintsev, Vladimir A., Adan, Ofer, Johanesen, Hayley, Strauss, Michael, Kenslea, Anne, Hakala, Chris, Kwakman, Laurens, Boullart, Werner, Mertens, Hans, Siew, Yong Kong, Barla, Kathy
Publikováno v:
Proceedings of SPIE; May 2019, Vol. 10959 Issue: 1 p109591C-109591C-9, 986329p
Autor:
Ukraintsev, Vladimir A., Adan, Ofer, Kwakman, Laurens, Kenslea, Anne, Johanesen, Hayley, Cramer, Jillian, Strauss, Michael, Boullart, Werner, Mertens, Hans, Siew, Yong Kong, Barla, Kathy
Publikováno v:
Proceedings of SPIE; May 2019, Vol. 10959 Issue: 1 p109590C-109590C-14, 10849425p
Autor:
Johanesen, Hayley, Kenslea, Anne, Williamson, Mark, Knowles, Matt, Kwakman, Laurens, Van Puymbroeck, Jan, Felder, Dan, Levi, Shimon, Nishry, Noam, Adan, Ofer, Englard, Ilan, Gov, Shahar, Cohen, Oded, Turovets, Igor
Publikováno v:
2015 26th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC); 2015, p329-335, 7p
Publikováno v:
AIP Conference Proceedings; 11/15/2011, Vol. 1395 Issue 1, p269-273, 5p
Publikováno v:
ECS Transactions; October 2006, Vol. 3 Issue: 2 p319-331, 13p