Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Kurtis Wickey"'
Autor:
Jeffrey Simon, Noah Mun, Anthony George, Josh Baur, James Busch, Christian Meadows, Katie Liszewski, Isabel Boona, Kurtis Wickey, Thomas Kent, Adam Kimura, Jamin McCue, Glen David Via, Brian Dupaix
Publikováno v:
2021 IEEE Physical Assurance and Inspection of Electronics (PAINE).
Autor:
Isabel Boona, Jonathan Scholl, Yash Patel, Kurtis Wickey, Jeremiah Schley, Nick Darby, Josh Baur
Publikováno v:
International Symposium for Testing and Failure Analysis.
Integrated circuit (IC) delayering workflows are highly reliant on operator experience to determine processing end points. The current method of end point detection during IC delayering uses qualitative correlations between the thickness and color of
Publikováno v:
The Review of scientific instruments. 86(1)
Comprehensive characterization of thermal properties in nanoscale heterostructures requires microscale thermally isolated platforms combined with sensitive thermometry in order to measure small heat accumulations. Amorphous SiNx membranes are often u