Zobrazeno 1 - 10
of 55
pro vyhledávání: '"Kuper, Fred"'
Publikováno v:
In Microelectronic Engineering 2009 86(2):140-144
Publikováno v:
In Microelectronics Reliability 2008 48(8):1581-1585
Publikováno v:
In Microelectronics Reliability 2005 45(9):1425-1429
Publikováno v:
In Microelectronics Reliability 2004 44(8):1269-1273
Publikováno v:
In Microelectronics Reliability 2003 43(9):1569-1575
Autor:
Li, Yuan, Jelle Veenstra, Klaas, Dubois, Jerôme, Peters-Wu, Lei, van Zomeren, Agnes, Kuper, Fred
Publikováno v:
In Microelectronics Reliability 2003 43(9):1449-1454
Publikováno v:
In Microelectronics Reliability 2002 42(9):1287-1292
Publikováno v:
In Microelectronics Reliability 2001 41(3):395-405
Publikováno v:
In Microelectronics Reliability 2000 40(1):117-122