Zobrazeno 1 - 9
of 9
pro vyhledávání: '"Kuo-Yang Horng"'
Publikováno v:
2020 IEEE International Symposium on Antennas and Propagation and North American Radio Science Meeting.
Calibration is an important issue for any phased array systems to work properly. Mid-Field Calibration Technology (MFCT) provides an fast and convenient way to calibrate an antenna array in the mid-field. With the improved MFCT to tolerate the parall
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::784991c7282835344ce1aae846370d68
https://doi.org/10.1109/ieeeconf35879.2020.9330189
https://doi.org/10.1109/ieeeconf35879.2020.9330189
Autor:
H.M. Chang, Kuo-Yang Horng, S.Y. Liao, C.L. Wu, Tsu Chang, Chih-Sheng Yeh, L.B. Chang, Hsuan-Ling Kao
Publikováno v:
International Journal of Electronics. 100:890-899
The DC and RF power characteristics of GaN HEMTs under continuous wave (CW) and pulsed load-pull measurement are examined, in this article. The results give a comprehensive understanding of self-heating effects and allow improved heat dissipation, by
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::65245d627224f186c7ae3c489b9d395c
https://doi.org/10.1080/00207217.2012.727347
https://doi.org/10.1080/00207217.2012.727347
Autor:
Yung-Hsiang Lin, Hsien-Chin Chiu, Liann-Be Chang, Ray-Ming Lin, Kuo-Yang Horng, Chih-Wei Yang
Publikováno v:
IEEE Transactions on Electron Devices. 55:3305-3309
In this brief, AlGaN/GaN metal-oxide-semiconductor high-electron-mobility transistors (MOS-HEMTs) using an electron-beam-evaporated praseodymium oxide layer (Pr2O3) in a high-oxygen-flow environment during the gate-dielectric-layer formation was stud
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8a192c54ddc7a8b3c32b4326d76dd735
https://doi.org/10.1109/ted.2008.2004851
https://doi.org/10.1109/ted.2008.2004851
Publikováno v:
Measurement Science and Technology. 17:N9-N12
A two-axis tilt sensor, consisting of two lenses and a CMOS image sensor, based on refractive law, is described here. This two-lens optical system, which has a bowl-shaped lens, is designed in such a way that one can find the tilt information for the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b2c60373a360726a588f4f47b4ba97a9
https://doi.org/10.1088/0957-0233/17/4/n01
https://doi.org/10.1088/0957-0233/17/4/n01
Publikováno v:
Japanese Journal of Applied Physics. 49:014104
In this paper we report the DC characteristics and radio frequency (RF) power performance improvement as high as 6.6% of asymmetric lightly doped drain metal–oxide–semiconductor field-effect transistors (asymmetric LDD MOSFET, AMOSFET) with 50-µ
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::93fedf2b099c8f446dc308f448f56b4f
https://doi.org/10.1143/jjap.49.014104
https://doi.org/10.1143/jjap.49.014104
Publikováno v:
Optical Engineering. 45:044302
A low-cost prototype of a laser range finder using a complementary metal-oxide semiconductor (CMOS) image sensor is developed for the automotive field. The system presented here is based on triangulation. The centroid of the infrared laser spot on th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f30e8d851bca6cb3779200a00330d7f6
https://doi.org/10.1117/1.2189831
https://doi.org/10.1117/1.2189831
Publikováno v:
Japanese Journal of Applied Physics. 44:3205
The formation and electrical characteristics of thermal gadolinium (Gd) oxide films were investigated. A good uniform interface formed by proper treatment was observed by transmission electron microscopy (TEM) examination. The dielectric constant of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3d6ed56f4f9f1a68507d1189947e6672
https://doi.org/10.1143/jjap.44.3205
https://doi.org/10.1143/jjap.44.3205
Autor:
Hsien-Chin Chiu, Chih-Wei Yang, Yung-Hsiang Lin, Ray-Ming Lin, Liann-Be Chang, Kuo-Yang Horng
Publikováno v:
IEEE Transactions on Electron Devices; Nov2008, Vol. 55 Issue 11, p3305-3309, 5p
Publikováno v:
Optical Engineering; Apr2006, Vol. 45 Issue 4, p044302-1-044302-7, 7p