Zobrazeno 1 - 10
of 22
pro vyhledávání: '"Kunikaza Izumi"'
Autor:
Kunikaza Izumi, Isaho Kamata, Toshiyuki Miyanagi, Tomonori Nakamura, Hidekazu Tsuchida, Tamotsu Jikimoto
Publikováno v:
Materials Science Forum. :721-724
We investigated the effect of high temperature annealing on the Schottky barrier height (Fb) and the ideality factor (n-factor) of a Mo contact. In a Mo contact, the Fb increased and the leakage current decreased by annealing at 600oC, while no incre
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::00a145dc338465632de0aced3c133fac
https://doi.org/10.4028/www.scientific.net/msf.483-485.721
https://doi.org/10.4028/www.scientific.net/msf.483-485.721
Autor:
Tomonori Nakamura, Katsunori Asano, Kunikaza Izumi, Hidekazu Tsuchida, R. Ishii, Koji Nakayama, Toshiyuki Miyanagi, Isaho Kamata, Yoshitaka Sugawara
Publikováno v:
Materials Science Forum. :97-100
In this paper, we investigated the density of basal plane dislocations (BPDs) in 4H-SiC epilayers grown on (0001) and (000-1). Re-polishing of the substrate surface, in-situ H2 etching and off-cut angle were found to influence the propagation of BPDs
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::abf83c0faa72456725e8f9dc7c36a710
https://doi.org/10.4028/www.scientific.net/msf.483-485.97
https://doi.org/10.4028/www.scientific.net/msf.483-485.97
Publikováno v:
Materials Science Forum. :323-326
We investigated the structure of the in-grown stacking faults (SFs) in the 4H-SiC epilayers. The in-grown SFs exhibited the photoluminescence (PL) peaks representing phonon replicas with bandgap of 2.710 eV. The in-grown SFs were confirmed to be tria
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d665bd099b144f63a23e562c73c1a556
https://doi.org/10.4028/www.scientific.net/msf.483-485.323
https://doi.org/10.4028/www.scientific.net/msf.483-485.323
Publikováno v:
Materials Science Forum. :379-382
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4c98e1d3b03b187f93435faff134bf9a
https://doi.org/10.4028/www.scientific.net/msf.457-460.379
https://doi.org/10.4028/www.scientific.net/msf.457-460.379
Publikováno v:
Materials Science Forum. :229-232
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::46d209f7af6bceb550d0f4ce9828e548
https://doi.org/10.4028/www.scientific.net/msf.457-460.229
https://doi.org/10.4028/www.scientific.net/msf.457-460.229
Publikováno v:
Materials Science Forum. :565-568
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0bca18470f7393e56b20b14de1d852b9
https://doi.org/10.4028/www.scientific.net/msf.457-460.565
https://doi.org/10.4028/www.scientific.net/msf.457-460.565
Publikováno v:
Materials Science Forum. :131-136
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::941848923b2b1b920f34719c7be08859
https://doi.org/10.4028/www.scientific.net/msf.433-436.131
https://doi.org/10.4028/www.scientific.net/msf.433-436.131
Publikováno v:
Materials Science Forum. :261-264
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::453c22b40de395fe031296dfd991b176
https://doi.org/10.4028/www.scientific.net/msf.433-436.261
https://doi.org/10.4028/www.scientific.net/msf.433-436.261
Publikováno v:
Defect and Diffusion Forum. :111-116
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::68c1cc57a56846b3b34a1f15a30b5d61
https://doi.org/10.4028/www.scientific.net/ddf.206-207.111
https://doi.org/10.4028/www.scientific.net/ddf.206-207.111
Autor:
Hiroyuki Fujisawa, Isaho Kamata, A. Ueda, Kunikaza Izumi, Katsunori Ueno, Hidekazu Tsuchida, Takashi Tsuji, Syunsuke Izumi, Tamotsu Jikimoto
Publikováno v:
Materials Science Forum. :1141-1144
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5e4d1a99c701d6e85319d54c8183257d
https://doi.org/10.4028/www.scientific.net/msf.389-393.1141
https://doi.org/10.4028/www.scientific.net/msf.389-393.1141