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pro vyhledávání: '"Kunal Rath"'
Autor:
Sameera Nalin Venkat, Jiqi Liu, Xuanji Yu, Jakob Wegmueller, Kunal Rath, Xinjun Li, Jean-Nicolas Jaubert, Jennifer L. Braid, Roger H. French, Laura S. Bruckman
Publikováno v:
2022 IEEE 49th Photovoltaics Specialists Conference (PVSC).
Autor:
Kenneth P. Boyce, Xiaohong Gu, Greg O'Brien, Colleen O'Brien, Raymond J. Wieser, Matthew Brown, Liang Ji, Stephanie L. Moffitt, Adam W. Hauser, Roger H. French, Kausik R. Choudhury, Evan Boucher, William J. Gambogi, Laura S. Bruckman, Ruben Zabalza, Jared Tracy, Silvana Ayala, Kunal Rath, Micheal D. Kempe
Publikováno v:
2021 IEEE 48th Photovoltaic Specialists Conference (PVSC).
Assessing photovoltaic module backsheet durability is critical to increasing module lifetime. Lab based accelerating testing has recently failed to predict large scale failures of widely adopted polymeric materials. Field surveyed data is critical to