Zobrazeno 1 - 10
of 15
pro vyhledávání: '"Kumpei Yoshikawa"'
Autor:
Kumpei Yoshikawa, Tetsuya Oshikata
Publikováno v:
2019 IEEE Third International Conference on DC Microgrids (ICDCM).
A proper magnetic component design is required for the realization of high performance power supply unit design. However there are many tradeoffs between design parameters, such as frequency, AC resistance, leakage inductance, component size, parasit
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::245b5b33a555a58ed43ea559e7ecdea5
https://doi.org/10.1109/icdcm45535.2019.9232900
https://doi.org/10.1109/icdcm45535.2019.9232900
Autor:
Tetsuya Oshikata, Kumpei Yoshikawa
Publikováno v:
2018 IEEE Energy Conversion Congress and Exposition (ECCE).
Designing a proper magnetic component for a power supply unit is essential for the realization of high performance product design. Usage of the electromagnetic simulation for magnetic components development is attracting attentions. Furthermore, mult
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9e5668f6e8c86c739f6fdf8c7f45c047
https://doi.org/10.1109/ecce.2018.8557932
https://doi.org/10.1109/ecce.2018.8557932
Publikováno v:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 23:2347-2351
The direct radio frequency power injection (DPI) method was extended using on-chip voltage waveform monitoring and built-in self-test techniques. Static random access memory (SRAM) has been chosen as a demonstrator of the extended DPI method and exhi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::18f2cbd040aff4944d2e2579702ecda7
https://doi.org/10.1109/tvlsi.2014.2361208
https://doi.org/10.1109/tvlsi.2014.2361208
AC Power Supply Noise Simulation of CMOS Microprocessor with LSI Chip-Package-Board Integrated Model
Publikováno v:
IEICE Transactions on Electronics. :264-271
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3623287281bedde6c7fd5ed36f4eebd8
https://doi.org/10.1587/transele.e97.c.264
https://doi.org/10.1587/transele.e97.c.264
Publikováno v:
IEICE Transactions on Electronics. :538-545
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a77f19a3fb3f3590c0ce0528596f7db5
https://doi.org/10.1587/transele.e96.c.538
https://doi.org/10.1587/transele.e96.c.538
Publikováno v:
IEICE Transactions on Electronics. :586-593
The susceptibility of a static random access memory (SRAM) core against static and dynamic variation of power supply voltage is evaluated, by using on-chip diagnosis structures of memory built-in self testing (MBIST) and on-chip voltage waveform moni
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4da7639673354f521a8f9cc8a2c7b9a3
https://doi.org/10.1587/transele.e95.c.586
https://doi.org/10.1587/transele.e95.c.586
Autor:
Sho Muroga, Yasushi Endo, Wataru Kodate, Yoshiaki Sasaki, Kumpei Yoshikawa, Yuta Sasaki, Makoto Nagata, Masahiro Yamaguchi
Publikováno v:
IEEE Transactions on Magnetics. 47:4485-4488
This paper reports the shielding effect of soft magnetic film as a thin film noise suppressor applied to a test chip implemented in 65 nm seven metal CMOS technology. This test chip is equipped with a noise generator circuit. The 0.2-1- μm-thick mag
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9986adcf2bb2044ac946ebc090414ef8
https://doi.org/10.1109/tmag.2011.2157328
https://doi.org/10.1109/tmag.2011.2157328
Publikováno v:
VLSI-DAT
This paper presents a low-power and compact passive supply-resonance (SR) suppression filter. By using an on-chip waveform monitor, a power-delivery network (PDN) impedance including package, and board PDNs is in-situ analyzed to identify the SR freq
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cf2ca48dc1bc0653d490f062395f8020
https://doi.org/10.1109/vlsi-dat.2014.6834894
https://doi.org/10.1109/vlsi-dat.2014.6834894
Autor:
Noriyuki Miura, Yuji Harada, Makoto Nagata, Kouji Ichikawa, Akitaka Murata, Kumpei Yoshikawa, Syuji Agatsuma
Publikováno v:
2013 IEEE International Meeting for Future of Electron Devices, Kansai.
This paper presents the measurements of power noise (Vdd noise) waveforms of a 5-stage inverter chain, using on-chip noise monitor circuits (OCM). The fine resolution of 0.4 mV in voltage and 12.5 ps in timing are realized. The undesired voltage vari
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::81abb8c78e0818dfa2b8991ede2895da
https://doi.org/10.1109/imfedk.2013.6602259
https://doi.org/10.1109/imfedk.2013.6602259
Publikováno v:
2013 IEEE International Conference on Microelectronic Test Structures (ICMTS).
SRAM exhibits the sensitivity of false operation against static and sinusoidal supply voltage variation. A measurement system combines direct radio frequency (RF) power injection, on-chip monitoring of voltage variation on power supply lines, and bui
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::91dd0ff747a9e6919664fd86196603d5
https://doi.org/10.1109/icmts.2013.6528149
https://doi.org/10.1109/icmts.2013.6528149