Study of fractality nature in VO2 films and its influence on metal-insulator phase transition.

Autor: Efremov, A. A., Romaniuk, B. M., Melnyk, V. P., Stadnik, O. A., Sabov, T. M., Kulbachinskiy, O. A., Dubikovskiy, O. V.

Publikováno v: Semiconductor Physics, Quantum Electronics & Optoelectronics; 2024, Vol. 27 Issue 1, p28-39, 12p