Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Kudryk, R.Ya."'
Publikováno v:
Semiconductor Physics, Quantum Electronics & Optoelectronics, Vol 19, Iss 3, Pp 248-254 (2016)
Electrical-heat-light degradation model of a light-emitting module has been developed in this work. The Monte-Carlo method was used to calculate the reliability time of LED modules with different halfwidth of LED chip series resistance. Separation of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5e7ef5b678f7c8a0f45cd7177e002068
http://dspace.nbuv.gov.ua/handle/123456789/121585
http://dspace.nbuv.gov.ua/handle/123456789/121585
We present the results of investigation of the barrier height and ideality factor in Schottky barrier diodes based on Au–TiB₂–n-SiC 6H relying on measuring the current-voltage and capacitance-voltage characteristics. Improving the accuracy of t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______1456::8e405c2b00bfaa43e6c592f4fe0fd19b
http://dspace.nbuv.gov.ua/handle/123456789/118424
http://dspace.nbuv.gov.ua/handle/123456789/118424
Autor:
Sorokin, V.M., Konakova, R.V., Kudryk, Ya.Ya., Zinovchuk, A.V., Bigun, R.I., Kudryk, R.Ya., Shynkarenko, V.V.
We present a setup and procedure of studying p-n junction to case thermal resistance in high-power light-emitting diodes (LEDs) from their thermal relaxation. A set of LEDs mounted on a metal-core printed circuit board (MCPCB) were studied. The contr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______1456::3617fab0c27592e4b871179309aa6ee9
http://dspace.nbuv.gov.ua/handle/123456789/118301
http://dspace.nbuv.gov.ua/handle/123456789/118301