Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Kuangwei Huang"'
Autor:
Changhua, He, Koji, Arizono, Hezhe, Ji, Yuka, Yakushiji, Daizhou, Zhang, Kuangwei, Huang, Yasuhiro, Ishibashi
Publikováno v:
The Journal of toxicological sciences. 43(7)
Total mercury (THg) and methylmercury (MeHg) bioaccumulation was explored in the Bimastus parvus species of earthworm (B. parvus) native to the leachate-contaminated forest soils around a Hg-polluted traditional landfill in Japan. General soil proper
Publikováno v:
Journal of Applied Physics; 5/15/2005, Vol. 97 Issue 10, p103535-1-103535-9, 9p, 2 Black and White Photographs, 2 Diagrams, 2 Charts, 8 Graphs
Autor:
Kuangwei Huang, John L. Volakis, Katsuo Kurabayashi, Linda L.-W. Chow, Brian D. Jensen, Kazuhiro Saitou
Publikováno v:
Journal of Microelectromechanical Systems. 14:935-946
This paper explores contact heating in microelectromechanical systems (MEMS) switches with contact spot sizes less than 100 nm in diameter. Experiments are conducted to demonstrate that contact heating causes a drop in contact resistance. However, ex
Autor:
Linda L.-W. Chow, Kazuhiro Saitou, Katsuo Kurabayashi, John L. Volakis, Kuangwei Huang, Brian D. Jensen
Publikováno v:
2004 IEEE MTT-S International Microwave Symposium Digest (IEEE Cat. No.04CH37535).
We have experimentally observed the failure of metal contact RF MEMS switches due to a rapid rise in contact resistance during switching. We were able to repair the failed switches through heating the contact asperities by applying sufficient contact
Publikováno v:
Journal of Applied Physics. 97:103535
We propose a technique to measure the opening time for micromachined switches and present substantial experimental data for switches with gold–gold contacts. The data demonstrate that contact opening time increases dramatically as apparent contact
Autor:
Jensen, Brian D., Chow, Linda L.-W., Kuangwei Huang, Kazuhiro Saitou, Volakis, John L., Katsuo Kurabayashi
Publikováno v:
Journal of Microelectromechanical Systems; Oct2005, Vol. 14 Issue 5, p935-946, 12p
Publikováno v:
2004 IEEE MTT-S International Microwave Symposium Digest (IEEE Cat. No.04CH37535); 2004, p1939-1939, 1p