Zobrazeno 1 - 10
of 16
pro vyhledávání: '"Kuang-Hong Gao"'
Publikováno v:
Physical Review B. 107
Publikováno v:
Carbon. 184:287-294
Electron-electron interactions (EEI) play a pivotal role in the transport behavior of carriers confined in a two-dimensional system. The strength of the interaction can be tuned by changing carrier concentration in a conventional two-dimensional syst
Publikováno v:
The Journal of Physical Chemistry C. 125:16858-16863
Publikováno v:
physica status solidi (RRL) – Rapid Research Letters. 16:2200110
Publikováno v:
Physical Review B. 102
Whether a metallic ground state exists in a two-dimensional system beyond Anderson localization remains an unresolved question. Recently, an intermediate anomalous metallic state is observed in several two-dimensional systems in the superconductor-in
Publikováno v:
Superconductor Science and Technology. 33:105010
We have investigated the low temperature isothermal current-voltage characteristics of FeSe epitaxial films with thickness of ∼ 360 nm at different magnetic fields parallel to the c axis. At zero magnetic field, with decreasing temperature a Berezi
Autor:
Ting-Ting Kang, Ning Dai, Kuang-Hong Gao, Hua-Yao Tu, Song-Ran Zhang, Yan Sun, Guolin Yu, Xin Chen
Publikováno v:
Japanese Journal of Applied Physics. 59:055501
Publikováno v:
Physical Review Applied. 10
Ruthenium dioxide is an important material, widely used in nanoelectronic devices and interconnects, supercapacitors, and as a catalyst. A good understanding of the origin of the low-frequency $1/f$ noise in RuO${}_{2}$'s resistivity will advance the
Publikováno v:
EPL (Europhysics Letters). 124:27006
This paper reports the study of the magneto-transport properties of a two-dimensional electron gas confined in inversion layers on HgCdTe with an inverted band structure. The magnetoresistance exhibits Shubnikov-de Hass oscillations, where beating pa
We systematically study the structures and electrical transport properties of a series of Sn-doped indium oxide (ITO) films with thickness $t$ ranging from $\sim$5 to $\sim$53\,nm. Scanning electron microscopy and x-ray diffraction results indicate t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0890ff9557150d9c59947f3c350d1d8f
http://arxiv.org/abs/1503.00863
http://arxiv.org/abs/1503.00863