Zobrazeno 1 - 5
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pro vyhledávání: '"Kuang-Chun Lin"'
Autor:
Kuang-Chun Lin, 林劻錞
107
With the advancement of the semi-conductor manufacturing process, the feature size of transistors shrinks aggressively. The chip size could thus become smaller. However, this also makes the chip more susceptible to manufacturing defects/nois
With the advancement of the semi-conductor manufacturing process, the feature size of transistors shrinks aggressively. The chip size could thus become smaller. However, this also makes the chip more susceptible to manufacturing defects/nois
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/ks9r5b
Publikováno v:
ITC-Asia
Implications have been shown to be beneficial for both concurrent error detection and diagnosis. To reduce the incurred hardware cost, one critical issue is selection of a minimum number of appropriate implications. Although the previous work develop
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8001d4f83036e470558f9a964e7d01f4
https://doi.org/10.1109/itc-asia.2019.00038
https://doi.org/10.1109/itc-asia.2019.00038
Akademický článek
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Autor:
Kuang, Guo Fang, Kuang, Chun Lin
Publikováno v:
Advanced Materials Research; July 2013, Vol. 718 Issue: 1 p1967-1972, 6p
Autor:
Kuang, Guo Fang, Kuang, Chun Lin
Publikováno v:
Applied Mechanics and Materials; January 2013, Vol. 281 Issue: 1 p597-602, 6p