The design of [formula omitted]-ADC in MEMS gyro interface ASIC

Autor: Tan, Jinhui, Kuang, Jishun, Hu, Xing, Cai, Xiaomin, Shi, Jiahe

Publikováno v: In Microelectronics Journal April 2023 134

Achieving low capture and shift power in linear decompressor-based test compression environment

Autor: Wang, Weizheng, Kuang, Jishun, You, Zhiqiang

Publikováno v: In Microelectronics Journal February 2012 43(2):134-140

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A New DFT Architecture to Reduce Test Data Volume and Test Application Time

Autor: Zhang Ling, Kuang Jishun, Mei Junjin

Publikováno v: Engineering Review : Međunarodni časopis namijenjen publiciranju originalnih istraživanja s aspekta analize konstrukcija, materijala i novih tehnologija u području strojarstva, brodogradnje, temeljnih tehničkih znanosti, elektrotehnike, računarstva i građevinarstva
Volume 36
Issue 3

This paper proposes a new DFT Architecture that contains three test scan modes. The test data could be interval broadcast to scan chains whenever the data in corresponding locations are compatible. Compared with the conventional broadcast scan archit

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=od_______951::98dd528bd3647e7a9fe36b7e96d4d98e
https://hrcak.srce.hr/file/244463

A Test Data Compression Method Based on K-L Transform

Autor: Kuang Jishun, Cheng Yali

Publikováno v: Proceedings of the 3rd International Conference on Computer Science and Service System.

A test data compression method based on K-L transform is presented in this paper. The original test vector is divided into two parts by using K-L transform: the reference vector and the error vector. The reference vector is implemented approximately

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::5681792b4dbbad2ecc3da7a01ce16937
https://doi.org/10.2991/csss-14.2014.81