Zobrazeno 1 - 9
of 9
pro vyhledávání: '"Kuan-Kan Hu"'
Publikováno v:
AIP Advances, Vol 5, Iss 10, Pp 107128-107128-5 (2015)
We investigate the evolution of two dimensional transient enhanced diffusion (TED) of phosphorus in sub-micron scale patterned silicon template. Samples doped with low dose phosphorus with and without high dose silicon self-implantation, were anneale
Externí odkaz:
https://doaj.org/article/db0132bf3be44b20af47630c943a33e0
Autor:
Kuan-kan Hu, 胡寬侃
103
The kinetics of solid phase epitaxial regrowth (SPER) is studied in amorphous silicon doping with dopant and isovalent impurities. Samples were co-implanted with phosphorus (P) and arsenic (As) to systematically form different proportion of
The kinetics of solid phase epitaxial regrowth (SPER) is studied in amorphous silicon doping with dopant and isovalent impurities. Samples were co-implanted with phosphorus (P) and arsenic (As) to systematically form different proportion of
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/6xgw23
Publikováno v:
Acta Materialia. 153:186-192
The evolution of the facet-facet groove at grain boundaries in multi-crystalline Si during solidification was investigated by in situ observation of the melt/crystal interface. The grain boundaries changed their propagation direction without any new
Autor:
Chuanshan Tian, Guosheng Shi, Nan Sheng, Gang Huang, Xing Liu, Y. Ron Shen, Kuan-Kan Hu, Haiping Fang, Yu-Chieh Wen
Publikováno v:
The Journal of Physical Chemistry C. 122:9111-9116
By combining theoretical calculations and experimental observations, we show that Na+ can be shared by three charged −COO– groups of the deprotonated carboxyl-terminated self-assembled monolayers i...
Publikováno v:
Applied Physics Express. 13:105501
The formation of multiple parallel twin boundaries at grain boundary grooves during Si solidification was investigated using an in situ observation system. Twin boundaries were repeatedly generated at a crystal/melt interface from a step-like grain b
Publikováno v:
Journal of Applied Physics; 2014, Vol. 116 Issue 3, p033503-1-033503-4, 4p, 3 Graphs
Publikováno v:
Materialia. 7:100386
The instability of crystal/melt interfaces including numerous Σ3, small-angle and large-angle grain boundaries during the unidirectional growth of Si was investigated, using an in situ observation system. Planar crystal/melt interfaces including Σ3
Publikováno v:
AIP Advances, Vol 5, Iss 10, Pp 107128-107128-5 (2015)
We investigate the evolution of two dimensional transient enhanced diffusion (TED) of phosphorus in sub-micron scale patterned silicon template. Samples doped with low dose phosphorus with and without high dose silicon self-implantation, were anneale
Publikováno v:
Applied Physics Express. 8:021302
Solid-phase-epitaxial-regrowth (SPER) dynamics of ion-implanted silicon were studied through in situ time-resolved reflectivity measurements. The roles of strain induced by dopant and isovalent impurities with different atomic sizes were disentangled