Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Kuan Fu Shen"'
Autor:
Su-Chang Chen, Chien-Hua Shen, Kuan-Fu Shen, Tsu-Chguan Shen, Hsi-Chi Hsiao, Jia Ming Chen, Hsiang-li Shen, Chun-Mei Chou, Yu-Jen Tsen
Publikováno v:
Proceedings of the 2017 International Conference on Management, Education and Social Science (ICMESS 2017).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::aa78e4f586f274d0554ef50c446bbcc8
https://doi.org/10.2991/icmess-17.2017.25
https://doi.org/10.2991/icmess-17.2017.25
Publikováno v:
FUZZ-IEEE
This paper proposes a robust automatic clustering algorithm based on the Hausdorff distance, called the self-updating clustering algorithm, for interval-valued data. This algorithm can simulate the self-clustering process. At the end of the clusterin
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7fbfc7b85a71af22ec19479274220ed3
https://doi.org/10.1109/fuzz-ieee.2016.7737867
https://doi.org/10.1109/fuzz-ieee.2016.7737867
Publikováno v:
Quality & Quantity. 45:587-597
This paper considers the analysis of exponential distributed lifetime data observed under k-stage step–stress accelerated life test under progressive type I censoring with random removal (PCRR), where the number of units removed at each stress foll
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8e41dd4b016efc6fc42f9c794aaf5feb
https://doi.org/10.1007/s11135-010-9315-y
https://doi.org/10.1007/s11135-010-9315-y
Autor:
Kuan Fu Shen, Su-Chang Chen, Chun Mei Chou, Jing Yi Chen, Hsi Chi Hsiao, Chin Pin Chen, Chien Hua Shen, Hsiang Li Shen, Jen-Chia Chang, Hui-Tzu Chang
Publikováno v:
Lecture Notes in Electrical Engineering ISBN: 9789400776173
This study examines 672 tertiary education students’ EG and its influencing factors. The results show that students’ e-Recruiting perceived (ERP) has a significant direct effect on employability growth (EG), and employability self-efficacy (ESE)
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ed4f5460561adaff67aa2dac613204d5
https://doi.org/10.1007/978-94-007-7618-0_137
https://doi.org/10.1007/978-94-007-7618-0_137
Autor:
Kuan-Fu Shen, 沈冠甫
95
First, this paper presents optimum plans for step-stress tests from a Bayes viewpoint. We obtain the optimum test plans to minimize the asymptotic variance of the maximum likelihood estimator of the mean life at a design (use) stress. The emp
First, this paper presents optimum plans for step-stress tests from a Bayes viewpoint. We obtain the optimum test plans to minimize the asymptotic variance of the maximum likelihood estimator of the mean life at a design (use) stress. The emp
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/11877758073654680219
Publikováno v:
2016 IEEE International Conference on Fuzzy Systems (FUZZ-IEEE); 2016, p1494-1500, 7p