Zobrazeno 1 - 10
of 16
pro vyhledávání: '"Krzysztof Dorywalski"'
Publikováno v:
Metrology and Measurement Systems, Vol 27, Iss 2, Pp 323-337 (2020)
Thiswork presents results of comparative studies of the optical absorption coefficient spectra of ion implanted layers in silicon. Three nondestructive and noncontact techniques were used for this purpose: spectroscopic ellipsometry (SE), modulated f
Externí odkaz:
https://doaj.org/article/1894e4f5167945f2a3b4d858e5e0e405
Autor:
Bohdan Andriyevsky, Leszek Bychto, Krzysztof Dorywalski, Ulrich Schade, Ljiljana Puskar, Aleksy Patryn, Aneta Hapka, Katarzyna Mydłowska, Alexander Veber, Andrii I. Kashuba, K.T. Ramakrishna Reddy
Optical reflection spectra of In2S3 thin films 180 730 nm deposited on glass substrates are measured by infrared spectroscopy using the synchrotron radiation of BESSY II storage ring in the spectral range of 30 8000 cm amp; 8722;1. The aim of the stu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c1accc15e1a5d6676342ab6aba9e35ec
http://www.helmholtz-berlin.de/pubbin/oai_publication?VT=1&ID=109381
http://www.helmholtz-berlin.de/pubbin/oai_publication?VT=1&ID=109381
Autor:
J. Piekarski, Bohdan Andriyevsky, A. I. Kashuba, I. V. Karpa, I. M. Kunyo, V. B. Stakhura, I. V. Semkiv, Michal Piasecki, Krzysztof Dorywalski, L. Andriyevska
Publikováno v:
Journal of Electronic Materials. 48:5586-5594
We investigate an influence of the crystal structure imperfections on the electronic properties and dielectric functions of the In0.5Tl0.5I semiconductor in the frame of the density functional theory calculations. The tensor of electron effective mas
Autor:
Tomasz Krzyzynski, Marie Bousquet, Marius Grundmann, Bohdan Andriyevsky, Krzysztof Dorywalski, N. Lemée, Michal Piasecki, Rüdiger Schmidt-Grund
Publikováno v:
Applied Surface Science. 421:367-372
Ultra-thin Na 0.5 Bi 0.5 TiO 3 films were epitaxially deposited on (001)SrTiO 3 substrate by pulsed laser deposition. From the ellipsometric spectra collected in the photon energy range 2÷8.7 eV, real and imaginary parts of the complex dielectric fu
Publikováno v:
Mechatronics. 37:33-41
The paper aims to provide spectroscopic ellipsometry technique as a tool for sensor materials studies. The principles of measurement, the ellipsometric data evaluation and the standard rotating analyzer configuration of the ellipsometric instrument a
Publikováno v:
Journal of Computational Science. 47:101201
A global-search method which applies the concept of genetic algorithm (GA) with gradient-based optimizer is proposed for the problem of experimental data analysis from spectroscopic ellipsometry on thin films. The method is applied to evaluate the da
Autor:
Bohdan Andriyevsky, I.V. Kityk, C. Cobet, Andrzej Majchrowski, M. Świrkowicz, Krzysztof Dorywalski, Michal Piasecki, Norbert Esser, Leszek R. Jaroszewicz
Publikováno v:
Journal of Alloys and Compounds. 577:237-246
The influence of 5% and 10% (in molar units) of ytterbium doping of RbNd(WO 4 ) 2 single crystals on the dielectric permittivity e in the spectral range of electronic excitations was studied. The corresponding differences of the pseudo-dielectric fun
Autor:
I.V. Kityk, Bohdan Andriyevsky, Christoph Cobet, Krzysztof Dorywalski, Michal Piasecki, Aleksy Patryn, Norbert Esser
Publikováno v:
Phase Transitions. 86:932-940
Results of thermo-optical investigations for lead germanate (Pb5Ge3O11), potassium dihydrogen phosphate (KH2PO4) ferroelectric crystals, and lead titanate (PbTiO3) thin films expitaxially deposited on (001) SrTiO3 substrate are presented in this arti
Autor:
M. Jaskólski, Aleksy Patryn, Norbert Esser, Z. Czapla, Bohdan Andriyevsky, Krzysztof Dorywalski
Publikováno v:
Materials Chemistry and Physics. 139:770-774
Optical dielectric functions e(E) of the (IPA)4Cd3Cl10 crystal were measured in the spectral range of fundamental electronic excitations 3.5–10 eV and in the temperature range of 310–400 K containing the phase transition point between the orthorh
Autor:
Christoph Cobet, Norbert Esser, Bohdan Andriyevsky, Krzysztof Dorywalski, Aleksy Patryn, Tadeusz Łukasiewicz, Michal Piasecki, Ivan Kityk
Publikováno v:
Optical Materials. 35:887-892
Complex refractive indices N = n + i k for a -cut Sr x Ba 1− x Nb 2 O 6 single crystals with four nominal values of composition x = 0.40; 0.50; 0.61; 0.75 were studied by spectroscopic ellipsometry in the photon energy range 2–5 eV of crystal tra