Zobrazeno 1 - 10
of 19
pro vyhledávání: '"Kryshtab, T.G"'
Autor:
Kryshtab, T.G., Borkovska, L.V., Kolomys, O.F., Korsunska, N.O., Strelchuk, V.V., Germash, L.P., Pechers’ka, К.Yu., Chornokur, G., Ostapenko, S.S., Phelan, C.M., Stroyuk, O.L.
Publikováno v:
In Superlattices and Microstructures March 2012 51(3):353-362
Autor:
Khomchenko, V.S., Kryshtab, T.G., Savin, A.K., Zavyalova, L.V., Roshchina, N.N., Rodionov, V.E., Lytvyn, O.S., Kushnirenko, V.I., Khachatryan, V.B., Andraca-Adame, J.A.
Publikováno v:
In Superlattices and Microstructures 2007 42(1):94-98
Autor:
Venger, E.F, Korsunska, N.O, Semenova, G.N, Klad’ko, V.P, Mazin, M.O, Borkovska, L.V, Kushnirenko, V.I, Sadofyev, Yu.G, Kryshtab, T.G, Vidal, M.A, Vargas, I.P
Publikováno v:
In Journal of Alloys and Compounds 26 May 2004 371(1-2):202-205
Publikováno v:
In Thin Solid Films 2002 403:76-80
Publikováno v:
In Applied Surface Science 2000 166(1):130-136
Publikováno v:
In Thin Solid Films 2000 373(1):79-83
Autor:
Lytvyn, O.S., Khomchenko, V.S., Kryshtab, T.G., Lytvyn, P.M., Mazin, M.O., Prokopenko, I.V., Rodionov, V.Ye., Tzyrkunov, Yu.A.
X-ray and atomic force microscopy techniques were used for investigations of crystalline structure and nano-morphology of ZnS:Cu thin films. The films were deposited by electron beam evaporation on substrates of various types (glass, BaTiO₃, silico
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______1456::422bbb601509fb744c6ecd11c2bed67c
http://dspace.nbuv.gov.ua/handle/123456789/119243
http://dspace.nbuv.gov.ua/handle/123456789/119243
The investigations of TiB₂/GaAs and Au-TiB₂/GaAs structural characteristics in dependence on technological regimes of sputtering and TiB2-film thicknesses as well as structural relaxation processes at short-term thermal annealing were carried out
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______1456::d390d2ccd8680a78ba409215a27b6855
http://dspace.nbuv.gov.ua/handle/123456789/119063
http://dspace.nbuv.gov.ua/handle/123456789/119063
Autor:
Kryshtab, T.G.1 tkrysh@esfm.ipn.mx, Korsunska, N.O.2, Sadofyev, Yu.G.3, Kladko, V.P.2, Borkovska, L.V.2, Mazin, M.O.2, Kushnirenko, V.I.2, Gudymenko, O.I.2, Venger, Ye.F.2
Publikováno v:
Materials Science & Engineering: C. Dec2003, Vol. 23 Issue 6-8, p715. 5p.
Publikováno v:
Advances in Science and Technology; October 2010, Vol. 75 Issue: 1 p202-207, 6p