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pro vyhledávání: '"Krisztian Gasparek"'
Publikováno v:
Advances in Electrical and Electronic Engineering, Vol 19, Iss 4, Pp 361-368 (2021)
On-die testing can accelerate development of semiconductor devices, but poses certain challenges related to high frequency and high current switching. This paper describes design and development of a tester for double-pulse switching test and measure
Externí odkaz:
https://doaj.org/article/d2924298673f4413afdd8ee3d41699ed
Autor:
Jozef Kozarik, Krisztian Gasparek, Tomas Zavodnik, Lubos Cernaj, Martin Jagelka, Martin Donoval
Publikováno v:
2022 14th International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM).