Zobrazeno 1 - 10
of 22
pro vyhledávání: '"Krishna Mohan Nandigana"'
Interferometry has been widely used for optical metrology and imaging applications because of their precision, reliability, and versatility. Although single-wavelength interferometery can provide high sensitivity and resolution, it has several drawba
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::565eb0be6fbdd78bac4a08a67ea7784d
https://hdl.handle.net/10356/80246
https://hdl.handle.net/10356/80246
White light single-shot interferometry with colour CCD camera for optical inspection of microsystems
Publikováno v:
SPIE Proceedings.
White light interferometry is a well-established optical tool for surface metrology of reflective samples. In this work, we discuss a single-shot white light interferometer based on single-chip color CCD camera and Hilbert transformation. The approac
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3646c67ea9a371fe39bef39fae80868d
https://doi.org/10.1117/12.2185802
https://doi.org/10.1117/12.2185802
Publikováno v:
SPIE Proceedings.
Single wavelength microscopic speckle interferometry is widely used for deformation, shape and non-destructive testing (NDT) of engineering structures. However the single wavelength configuration fails to quantify the large deformation due to the ove
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::66bf9f161920146332d789e0ca7b83d1
https://doi.org/10.1117/12.2081122
https://doi.org/10.1117/12.2081122
White light interferometry (WLI) is a state-of-the-art technique for high resolution full-filed 3-D surface profiling of Microsystems. However, the WLI is rather slow, because the number of frames to be recorded and evaluated is large compared to the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::536daa5211b28fe1ad8708b236641b1f
Autor:
Paul Kumar Upputuri, Manojit Pramanik, Krishna Mohan Nandigana, Mahendra P. Kothiyal, Li Gong, Haifeng Wang
Publikováno v:
Optics express. 22(22)
White light interferometry is a widely used tool to extend the unambiguous measurement range of a monochromatic interferometer. In this work, we discuss Hilbert transformation analysis of a single white light interferogram acquired with a single-chip
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d0859f89abd26512bfa29fd5ea59df84
https://pubmed.ncbi.nlm.nih.gov/25401886
https://pubmed.ncbi.nlm.nih.gov/25401886
Autor:
Somasundaram Umapathy, Manojit Pramanik, M. P. Kothiyal, Paul Kumar Upputuri, Krishna Mohan Nandigana
Publikováno v:
IndraStra Global.
Single wavelength TV holography is a widely used whole-field noncontacting optical method for nondestructive testing (NDT) of engineering structures. However, with a single wavelength configuration, it is difficult to quantify the large amplitude def
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::35d5f2d43e893b43469fc05992c60826
https://igi.indrastra.com/items/show/81810
https://igi.indrastra.com/items/show/81810
Autor:
Krishna Mohan, Nandigana
Publikováno v:
Proceedings of SPIE; Nov2005 Part 2, Issue 1, p59120C-59120C-7, 7p
Publikováno v:
Proceedings of SPIE; Nov2002, Issue 1, p184-188, 5p
Autor:
Krishna Mohan, Nandigana K.
Publikováno v:
Proceedings of SPIE; Nov2001, Issue 1, p135-143, 9p
Publikováno v:
Proceedings of SPIE; Nov2000 Part 2, Issue 1, p205-215, 11p