Raman study of water deposited in solid argon matrix

Autor: Vlasta Mohaček-Grošev, Krešimir Furić, Vedran Vujnović

Publikováno v: Spectrochimica acta. Part A, Molecular and biomolecular spectroscopy

New Raman data are presented concerning H2O and D2O water aggregation in argon matrix having the ratio of number of argon atoms to water molecules close to 40:1. Experiments were conducted at temperatures from 8 K to 34 K allowing observation of OH a

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::02015fe7f5dbf975c0ee0a6c88267fb4

Surface characterization of thin silicon-rich oxide films

Autor: Maurizio Ferrari, Václav Holý, Svetozar Musić, Maurizio Mazzola, Krešimir Furić, Mira Ristić, Marijan Marciuš, Davor Ristić, Mile Ivanda, Giancarlo C. Righini, Ozren Gamulin, Alessandro Chiasera, Maja Buljan

Publikováno v: Journal of molecular structure
993 (2011): 214–218. doi:10.1016/j.molstruc.2010.11.066
info:cnr-pdr/source/autori:D. Ristic, V. Holy, M. Ivanda, M. Marcius, M. Buljan, O. Gamulin, K. Furic, M. Ristic, S. Music, M. Mazzola, A. Chiasera, M. Ferrari, G.C. Righini/titolo:Surface characterization of thin silicon-rich oxide films/doi:10.1016%2Fj.molstruc.2010.11.066/rivista:Journal of molecular structure (Print)/anno:2011/pagina_da:214/pagina_a:218/intervallo_pagine:214–218/volume:993

The silicon-rich oxide (SiO x ) films were deposited using the LPCVD (Low Pressure Chemical Vapour Deposition) method at the temperature of 570 °C and with silane and oxygen as the reactant gasses. The films were deposited on silicon (1 1 1) substra

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::93dbb6047e4554b587864065d0a407a9
https://doi.org/10.1016/j.molstruc.2010.11.066

Water ice at low temperatures and pressures: New Raman results

Autor: Vesna Volovšek, Krešimir Furić

Publikováno v: Journal of Molecular Structure. 976:174-180

Within the two types of experiments, both securing high sample’s purity, solid phases of water were studied in the region of low temperatures (above 8 K) and low pressure, conditions similar to the very upper atmosphere. Spectral features character

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5b8e18e09c148528f9427a2e8451cdce
https://doi.org/10.1016/j.molstruc.2010.03.024

Inferring fractal dimension of rough/porous surfaces—A comparison of SEM image analysis and electrochemical impedance spectroscopy methods

Autor: Dubravko Risović, Miroslav Gojo, Krešimir Furić, S. Mahovic Poljacek

Publikováno v: Applied Surface Science. 255:3063-3070

There are many methods for analysis and description of surface topographies that rely on analysis of surface images obtained by various methods such as SEM or AFM. However, they can seldom provide quantitative topographical information. Such informat

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::747715c12bb87e5ffd7a25fb3a8afc22
https://doi.org/10.1016/j.apsusc.2008.08.106

Comparison of fractal and profilometric methods for surface topography characterization

Autor: Miroslav Gojo, Dubravko Risović, Krešimir Furić, S. Mahovic Poljacek

Publikováno v: Applied Surface Science. 254:3449-3458

In this study micro-structural and roughness characterization of surface of aluminium foils used in lithographic printing process was performed by contact and non-contact profilometric methods and fractal analysis. Significant differences in roughnes

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::72886b6da43e96ba0d13d2168d38fdc5
https://doi.org/10.1016/j.apsusc.2007.11.040