Výsledky vyhledávání - "Krause, Gernot"

Conference

Impact of BTI Stress on RF Small Signal Parameters of FDSOI MOSFETs

Autor: Chohan, Talha, Slesazeck, Stefan, Trommer, Jens, Krause, Gernot, Bossu, Germain, Lehmann, Steffen, Mikolajick, Thomas

The growing interest in high speed and RF technologies assert for the importance of reliability characterization beyond the conventional DC methodology. In this work, the influence of bias temperature instability (BTI) stress on RF small signal param

Externí odkaz: https://tud.qucosa.de/id/qucosa%3A79705
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Conference

Off-state Impact on FDSOI Ring Oscillator Degradation under High Voltage Stress

Autor: Trommer, Jens, Havel, Viktor, Chohan, Talha, Mehmood, Furqan, Slesazeck, Stefan, Krause, Gernot, Bossu, Germain, Arfaoui, Wafa, Mühlhoff, Armin, Mikolajick, T.

The degradation predicted by classical DC reliability methods, such as bias temperature instability (BTI) and hot carrier injection (HCI), might not translate sufficiently to the AC conditions, which are relevant on the circuit level. The direct anal

Externí odkaz: https://tud.qucosa.de/id/qucosa%3A76936
https://tud.qucosa.de/api/qucosa%3A76936/attachment/ATT-0/

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