Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Koya Satta"'
Publikováno v:
Solids, Vol 2, Iss 2, Pp 129-138 (2021)
We applied photoreflectance (PR) spectroscopy for contactless determination of the electric field strength at buried interfaces in metal–insulator–semiconductor (MIS) structures. The PR is an all-optical version of an electromodulated reflectance
Externí odkaz:
https://doaj.org/article/8fc7eda812a84d2390062df313e9779f
Publikováno v:
Solids, Vol 2, Iss 8, Pp 129-138 (2021)
Solids
Volume 2
Issue 2
Pages 8-138
Solids
Volume 2
Issue 2
Pages 8-138
We applied photoreflectance (PR) spectroscopy for contactless determination of the electric field strength at buried interfaces in metal–insulator–semiconductor (MIS) structures. The PR is an all-optical version of an electromodulated reflectance