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pro vyhledávání: '"Koushi Hotta"'
Autor:
Ryosuke Aonuma, Isao Makabe, Koushi Hotta, Yasuyuki Miyamoto, Shigeki Yoshida, Akihiro Hayasaka
Publikováno v:
2019 Compound Semiconductor Week (CSW).
Insulator deposition directly on the GaN channel is necessary for the reduction of gate leakage current in N-polar GaN HEMTs. For higher speed, a thinner insulator is preferable. Therefore, the N-polar GaN HEMT with Al 2 O 3 gate insulator was fabric
Autor:
Koushi Hotta, Yasuyuki Miyamoto, Isao Makabe, Kosuke Itagaki, Yumiko Tomizuka, Shigeki Yoshida
Publikováno v:
Japanese Journal of Applied Physics. 58:SCCD14