Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Kouji Sumi"'
Autor:
Masami Murai, H Qiu, K Takei, Hiroyuki Kamei, Mituru Hashimoto, Souichi Moriya, Masato Shimada, Kouji Sumi, Tsutomu Nishiwaki
Publikováno v:
Thin Solid Films. 349:270-275
A 750 nm-thick PZT-PMN/PZT composite film was prepared by sequential multiple spin-coatings. First, a 375 nm-thick sol-gel Pb(Zr0.56Ti0.44)O3 (PZT) layer was prepared on a Ti/Pt/Ti bottom electrode and then a 375 nm-thick Pb(Zr0.56Ti0.44)0.80(Mg1/3Nb
Autor:
Hiroyuki Kamei, Kouji Sumi, H Qiu, Souichi Moriya, Masami Murai, Tsutomu Nishiwaki, K Takei, Masato Shimada, Mituru Hashimoto, Satoru Miyashita
Publikováno v:
Thin Solid Films. 330:183-189
Sol-gel Pb(Zr0.56Ti0.44)0.90(Mg1/3Nb2/3)0.10O3 (PZT-PMN) films were prepared onto the Ti/Pt/Ti bottom electrode by multilayer spin coating. The film thickness ranged from 0.22 to 0.88 μm. The Pt top electrodes were deposited on the PZT-PMN films by
Autor:
Hiroyuki Kamei, H Qiu, Masami Murai, Mituru Hashimoto, K Takei, Masato Shimada, Souichi Moriya, Tsutomu Nishiwaki, Satoru Miyashita, Kouji Sumi
Publikováno v:
Thin Solid Films. 315:77-85
Sol–gel Pb(Zr 0.56 Ti 0.44 ) 0.90 (Mg 1/3 Nb 2/3 ) 0.10 O 3 (PZT–PMN) films 1 μ m thick were prepared onto the Ti/Pt/Ti bottom electrodes by six layer spin-coatings. After the first triple layer coatings, a pre-annealing was carried out by rapid
Autor:
Shinri Sakai, Soichi Moriya, Shiro Yazaki, Hong Qiu, Yoshinao Miyata, Kouji Sumi, Masato Shimada, Masami Murai, Tsutomu Nishiwaki
Publikováno v:
Japanese Journal of Applied Physics. 38:4843
The effect of orientation and composition on electrically induced strain and relative permittivity of 600-nm-thick Pb(Zr x Ti1-x )O3 (PZT) films was investigated. High permittivity was obtained near the morphotropic phase boundary (MPB) composition,
Publikováno v:
Japanese Journal of Applied Physics. 38:886
The 800-nm-thick 0.9 Pb(Zr,Ti)O3–0.1 Pb(Mg,Nb)O3 (PZT–PMN) were prepared by metalorganic deposition (MOD) process on Ti/Pt/Ti bottom electrodes. The structure of the films was investigated by scanning electron microscopy and X-ray diffraction. Th