Zobrazeno 1 - 10
of 42
pro vyhledávání: '"Kouhei Ohtani"'
Autor:
Kensaku Shimada, Kouhei Ohtani, Pushpa Kiran Gullapalli, Akihide Yoshihara, Kazuya Akimitsu, Ken Izumori
Publikováno v:
Bulletin of Applied Glycoscience. 12:33-39
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::04ea279f754cfd3887ae8560ac368818
https://doi.org/10.5458/bag.12.1_33
https://doi.org/10.5458/bag.12.1_33
Autor:
Ken Izumori, Kenji Gomi, Shigeyuki Tajima, Kazuya Ichimura, Kouhei Ohtani, Keiji Tanaka, Susumu Mochizuki, Kazuya Akimitsu, Takeshi Fukumoto, Yoshio Shigematsu, Koichi Ebihara, Toshiaki Ohara, Akihide Yoshihara
Publikováno v:
Communications Biology, Vol 3, Iss 1, Pp 1-15 (2020)
Communications Biology
Communications Biology
The rare sugar d-tagatose is a safe natural product used as a commercial food ingredient. Here, we show that d-tagatose controls a wide range of plant diseases and focus on downy mildews to analyze its mode of action. It likely acts directly on the p
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::eb5961d6214e6bdf5989133afa1939c3
http://link.springer.com/article/10.1038/s42003-020-01133-7
http://link.springer.com/article/10.1038/s42003-020-01133-7
Publikováno v:
KAGAKU TO SEIBUTSU. 56:752-758
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::13e69894611bdc5f004d9274d87b4099
https://doi.org/10.1271/kagakutoseibutsu.56.752
https://doi.org/10.1271/kagakutoseibutsu.56.752
Autor:
Kazushi Matsudaira, Yoshio Shigematsu, Yutaka Ishida, Akihide Yoshihara, Akihito Kano, Kazuya Ichimura, Kazuya Akimitsu, Susumu Mochizuki, Kenji Gomi, Toshiaki Ohara, Kouhei Ohtani, Ayaka Aki, Ken Izumori, Takeshi Fukumoto
Publikováno v:
Japanese Journal of Pesticide Science. 42:99-103
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cc707cfd0c275da67a6af2dc5dee26bd
https://doi.org/10.1584/jpestics.w17-35
https://doi.org/10.1584/jpestics.w17-35
Autor:
Syu Matsuoka, Mikihiro Yamamoto, Kazuya Ichimura, Motoichiro Kodama, Kouhei Ohtani, Susumu Mochizuki, Kenji Gomi, Mai Katsumoto, Takashi Tsuge, Kazuya Akimitsu, Chika Igarashi, Sawa Tanaka, Takuya Shimagami
Publikováno v:
Physiological and Molecular Plant Pathology. 95:93-96
Alternaria black rot, Alternaria leaf spot of rough lemon, and Alternaria brown spot of tangerines are three major citrus Alternaria pathogens. Citrus could be considered as a molecular contact point for host-selective toxin (HST)-mediated co-evoluti
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::963a7721a80f0ee28f914a861ed80dd0
Autor:
Hiromi Yoshida, Akihide Yoshihara, Pushpa Kiran Gullapalli, Ken Izumori, Shigehiro Kamitori, Kazuya Akimitsu, Kouhei Ohtani
Publikováno v:
Acta Crystallogr F Struct Biol Commun
The X-ray structure of ketose 3-epimerase from Arthrobacter globiformis M30, which was previously reported to be a D-allulose 3-epimerase (AgD-AE), was determined at 1.96 Å resolution. The crystal belonged to the hexagonal space group P6522, with un
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::11a518709829dfbc1f9907e7e0d74374
https://europepmc.org/articles/PMC6168773/
https://europepmc.org/articles/PMC6168773/
Publikováno v:
2017 IEEE CPMT Symposium Japan (ICSJ).
We have proposed a power supply circuit and an electrical interconnect test method based on charge volume supplied from the power supply circuit. We optimize the supply circuit so as for small resistive open defects that occur at interconnects among
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::42cfb4fb95d8a11114e7bf40aabb147a
https://doi.org/10.1109/icsj.2017.8240124
https://doi.org/10.1109/icsj.2017.8240124
A defect level monitor of resistive open defect at interconnects in 3D ICs by injected charge volume
Publikováno v:
ISCIT
Resistive open defects may occur at interconnects among dies in 3D stacked ICs. A defect level monitor is proposed so as for the defects to be detected before they change into a hard open defect that generates logical errors. The changing process of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9ee6c694576188169a2527e742402e89
https://doi.org/10.1109/iscit.2017.8261176
https://doi.org/10.1109/iscit.2017.8261176
Autor:
Kenji Gomi, Akira Masunaka, Hiroshi Katoh, Takuya Ishimoto, Kazuya Akimitsu, Shinsuke Yasuda, Akihito Kano, Kazuya Ichimura, Yasuomi Tada, Miyu Saitoh, Yuriko Izumi, Kouhei Ohtani, Soushi Nishida, Y. Miyamoto, Takeshi Fukumoto
Publikováno v:
Genome-Enabled Analysis of Plant-Pathogen Interactions
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7805e935e0be8e0ec762b5b6f26da0bf
https://doi.org/10.1094/9780890544983.015
https://doi.org/10.1094/9780890544983.015
Publikováno v:
2016 IEEE CPMT Symposium Japan (ICSJ).
A power supply circuit and an electrical interconnect test method are proposed to detect open defects at interconnects between dies in 3D ICs. The test method is based on the amount of charge injected from the power supply voltage source. It is shown
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b8c50d8a88434e251da9fb0ec1f67a05
https://doi.org/10.1109/icsj.2016.7801303
https://doi.org/10.1109/icsj.2016.7801303