Zobrazeno 1 - 10
of 118
pro vyhledávání: '"Kosuke O. Hara"'
Publikováno v:
AIP Advances, Vol 13, Iss 7, Pp 075219-075219-5 (2023)
We report on the formation of a tellurium nanosheet with a MoOx cap by thermal annealing of ion-implanted 2H–MoTe2 multilayers. The presence of crystal defects generated by ion implantation at an energy of 90 keV accelerates the incorporation of O
Externí odkaz:
https://doaj.org/article/f239a21fbaed467397c8da813f017f28
Publikováno v:
Journal of Electronic Materials.
Autor:
Kosuke O. Hara
Publikováno v:
The Journal of Physical Chemistry C. 125:24310-24317
Autor:
Taisuke Fujisawa, Atsushi Onogawa, Miki Horiuchi, Yuichi Sano, Chihiro Sakata, Junji Yamanaka, Kosuke O. Hara, Kentarou Sawano, Kiyokazu Nakagawa, Keisuke Arimoto
Publikováno v:
Materials Science in Semiconductor Processing. 161:107476
Publikováno v:
Japanese Journal of Applied Physics. 62:SK1011
A composition ratio prediction model for BaSi2 thin films deposited by thermal evaporation was constructed using machine learning. BaSi2 was prepared by thermal evaporation in a vacuum chamber, and the composition ratio was measured by energy-dispers
Publikováno v:
Materials Advances. 2:6713-6721
BaSi2 is an emerging photovoltaic material with optimum optoelectronic properties and can be deposited by close-spaced evaporation, which has the advantages of epitaxial growth, high productivity, and scalability to large area deposition. This proces
Autor:
Kentarou Sawano, Noritaka Usami, Kiyokazu Nakagawa, Junji Yamanaka, Keisuke Arimoto, Kosuke O. Hara
Publikováno v:
ECS Transactions. 98:277-290
Strain engineering of group IV semiconductors has been extensively investigated with an aim to produce high mobility platform for high performance electronic devices. In particular, combination of strain and 3D structures requires elaborate engineeri
Publikováno v:
JJAP Conference Proceedings. 10:011101-011101
Autor:
Junji Yamanaka, Takuya Oguni, Yuichi Sano, Yusuke Ohshima, Atsushi Onogawa, Kosuke O Hara, Keisuke Arimoto
Publikováno v:
Microscopy and Microanalysis. 28:2812-2813
Autor:
Keisuke Arimoto, Shingo Saito, Atsushi Onogawa, Junji Yamanaka, Kosuke O. Hara, Yuichi Sano, Kiyokazu Nakagawa
Publikováno v:
Microscopy and Microanalysis. 26:286-288