Zobrazeno 1 - 10
of 51
pro vyhledávání: '"Kopanski, J. J."'
Autor:
Huber, H. P., Humer, I., Hochleitner, M., Fenner, M., Moertelmaier, M., Rankl, C., Imtiaz, A., Wallis, T. M., Tanbakuchi, H., Hinterdorfer, P., Kabos, P., Smoliner, J., Kopanski, J. J., Kienberger, F.
Publikováno v:
Journal of Applied Physics; Jan2012, Vol. 111 Issue 1, p014301, 9p, 1 Color Photograph, 6 Graphs
Publikováno v:
Journal of Applied Physics; 8/15/2003, Vol. 94 Issue 4, p2680-2685, 6p, 6 Graphs
Autor:
Marchiando, J. F., Kopanski, J. J.
Publikováno v:
Journal of Applied Physics; 11/15/2002, Vol. 92 Issue 10, p5798, 12p, 1 Diagram, 14 Graphs
Autor:
Ryan, J. T., Yu, L. C., Han, J. H., Kopanski, J. J., Cheung, K. P., Zhang, F., Wang, C., Campbell, J. P., Suehle, J. S., Tilak, V., Fronheiser, J.
n/a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______2659::8d1d2f7bf32ea7d9168911db92a76d2b
https://zenodo.org/record/1273834
https://zenodo.org/record/1273834
Autor:
Sayan, S., Bartynski, R.A., Robertson J., Suehle, J. S., Vogel, E., Nguyen, N. V., Ehrstein, J., Kopanski, J. J., Süzer, Şefik, Holl, M. B., Garfunkel, E.
Publikováno v:
Proceedings of the International Symposium on Advanced Short-time Thermal Processing for Si-based CMOS Devices II
Date of Conference: 10-12 May 2004 Conference Name: International Symposium on Advanced Short-time Thermal Processing for Si-based CMOS Devices II We have studied the HfO 2/Hf and HfO 2/Pt systems by photoemission and inverse photoemission spectrosco
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______3533::4076994e4317129a391e8b8997f96a7b
https://hdl.handle.net/11693/27442
https://hdl.handle.net/11693/27442
Publikováno v:
Journal of Applied Physics; 10/15/1987, Vol. 62 Issue 8, p3469, 3p, 2 Graphs
Publikováno v:
AIP Conference Proceedings; 9/26/2007, Vol. 931 Issue 1, p530-534, 5p, 2 Diagrams, 1 Chart, 4 Graphs
Publikováno v:
Scanning Probe Microscopy (9780387286679); 2007, p88-112, 25p
Autor:
Kopanski, J. J.
Publikováno v:
MRS Online Proceedings Library; 2004, Vol. 838 Issue 1, p217-228, 12p
Publikováno v:
AIP Conference Proceedings; 2001, Vol. 550 Issue 1, p635, 6p